解像度: 1.8→40.72 Å / Cor.coef. Fo:Fc: 0.959 / Cor.coef. Fo:Fc free: 0.947 / SU B: 4.208 / SU ML: 0.059 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.097 / ESU R Free: 0.094 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : RESIDUAL ONLY
Rfactor
反射数
%反射
Selection details
Rfree
0.20866
3084
5.1 %
RANDOM
Rwork
0.18673
-
-
-
obs
0.18782
57931
99.82 %
-
all
-
61151
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 29.876 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.36 Å2
0.18 Å2
0 Å2
2-
-
0.36 Å2
0 Å2
3-
-
-
-0.55 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.8→40.72 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3115
0
0
374
3489
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.022
3238
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.249
1.963
4408
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.251
5
398
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.288
23.885
157
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.484
15
549
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.998
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.094
0.2
482
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.021
2493
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.907
1.5
1961
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.764
2
3182
X-RAY DIFFRACTION
r_scbond_it
2.43
3
1277
X-RAY DIFFRACTION
r_scangle_it
4.166
4.5
1220
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.8→1.847 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.272
214
-
Rwork
0.239
4202
-
obs
-
-
99.95 %
精密化 TLS
手法: refined / Origin x: 24.8727 Å / Origin y: 37.3876 Å / Origin z: -26.871 Å