Component-ID: 1 / Ens-ID: 1 / Beg auth comp-ID: ASP / Beg label comp-ID: ASP / End auth comp-ID: ALA / End label comp-ID: ALA / Refine code: 4 / Auth asym-ID: A / Label asym-ID: A / Auth seq-ID: 29 - 293 / Label seq-ID: 1 - 265
モノクロメーター: Si(111) / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1 Å / 相対比: 1
反射
解像度: 2.29→40.262 Å / Num. all: 11647 / Num. obs: 11647 / % possible obs: 96.2 %
反射 シェル
最高解像度: 2.29 Å
-
解析
ソフトウェア
名称
バージョン
分類
HKL-2000
データ収集
AMoRE
位相決定
REFMAC
5.5.0102
精密化
HKL-2000
データスケーリング
精密化
構造決定の手法: 分子置換 / 解像度: 2.29→40.26 Å / Cor.coef. Fo:Fc: 0.952 / Cor.coef. Fo:Fc free: 0.895 / SU B: 15.688 / SU ML: 0.177 / 交差検証法: THROUGHOUT / ESU R: 0.418 / ESU R Free: 0.28 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.2636
557
4.8 %
RANDOM
Rwork
0.17307
-
-
-
obs
0.17734
11050
95.44 %
-
all
-
11050
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 28.652 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.47 Å2
0 Å2
0 Å2
2-
-
1.38 Å2
0 Å2
3-
-
-
0.09 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.29→40.26 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1982
0
27
237
2246
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.022
2029
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.631
1.972
2772
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.775
5
264
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
39.443
23.333
87
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.935
15
301
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
22.833
15
18
X-RAY DIFFRACTION
r_chiral_restr
0.105
0.2
319
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
1562
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.811
1.5
1315
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.465
2
2101
X-RAY DIFFRACTION
r_scbond_it
2.612
3
714
X-RAY DIFFRACTION
r_scangle_it
4.071
4.5
671
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
Refine LS restraints NCS
Dom-ID: 1 / Auth asym-ID: A / Ens-ID: 1 / 数: 1982 / Refine-ID: X-RAY DIFFRACTION / Rms dev position: 0 Å
タイプ
Weight position
mediumpositional
0.5
mediumthermal
2
LS精密化 シェル
解像度: 2.29→2.35 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.247
38
-
Rwork
0.174
784
-
obs
-
-
93.62 %
精密化 TLS
手法: refined / Origin x: -7.2843 Å / Origin y: -6.9233 Å / Origin z: -8.6345 Å