SHEET DETERMINATION METHOD: DSSP THE SHEETS PRESENTED AS "AB" IN EACH CHAIN ON SHEET RECORDS BELOW ... SHEET DETERMINATION METHOD: DSSP THE SHEETS PRESENTED AS "AB" IN EACH CHAIN ON SHEET RECORDS BELOW IS ACTUALLY AN 6-STRANDED BARREL THIS IS REPRESENTED BY A 7-STRANDED SHEET IN WHICH THE FIRST AND LAST STRANDS ARE IDENTICAL.
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.94 Å / 相対比: 1
反射
解像度: 1.25→49.3 Å / Num. obs: 75396 / % possible obs: 92.8 % / Observed criterion σ(I): 2 / 冗長度: 5.2 % / Biso Wilson estimate: 13.6 Å2 / Rmerge(I) obs: 0.07 / Net I/σ(I): 14.8
反射 シェル
解像度: 1.25→1.33 Å / 冗長度: 2.5 % / Rmerge(I) obs: 0.74 / Mean I/σ(I) obs: 1.8 / % possible all: 75
-
解析
ソフトウェア
名称
バージョン
分類
BUSTER
2.11.5
精密化
XDS
データ削減
Aimless
データスケーリング
PHASER
位相決定
精密化
構造決定の手法: 分子置換 / 解像度: 1.25→49.35 Å / Cor.coef. Fo:Fc: 0.9336 / Cor.coef. Fo:Fc free: 0.9247 / SU R Cruickshank DPI: 0.043 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.045 / SU Rfree Blow DPI: 0.047 / SU Rfree Cruickshank DPI: 0.045 詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. ALL ATOMS HAVE CCP4 ATOM TYPE FROM LIBRARY. THE LIGAND J4X IS PLACED IN THE DENSITY IN TWO DIFFERENT ORIENTATIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.1951
3777
5.03 %
RANDOM
Rwork
0.1755
-
-
-
obs
0.1764
75043
92.88 %
-
原子変位パラメータ
Biso mean: 21.11 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0 Å2
0 Å2
0 Å2
2-
-
0 Å2
0 Å2
3-
-
-
0 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.25→49.35 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1850
0
73
333
2256
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
2158
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.11
2951
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
787
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
51
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
355
HARMONIC
5
X-RAY DIFFRACTION
t_it
2158
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
4.63
X-RAY DIFFRACTION
t_other_torsion
15.58
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
270
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
2680
SEMIHARMONIC
4
LS精密化 シェル
解像度: 1.25→1.28 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.2884
229
5.44 %
Rwork
0.284
3982
-
all
0.2843
4211
-
obs
-
-
92.88 %
精密化 TLS
手法: refined / Origin x: -28.5217 Å / Origin y: -42.8729 Å / Origin z: -10.8567 Å