解像度: 1.91→40.62 Å / Cor.coef. Fo:Fc: 0.9474 / Cor.coef. Fo:Fc free: 0.9361 / SU R Cruickshank DPI: 0.144 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.158 / SU Rfree Blow DPI: 0.134 / SU Rfree Cruickshank DPI: 0.129 詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. ALL ATOMS HAVE CCP4 ATOM TYPE FROM LIBRARY
Rfactor
反射数
%反射
Selection details
Rfree
0.1982
941
5.12 %
RANDOM
Rwork
0.1629
-
-
-
obs
0.1646
18377
99.23 %
-
原子変位パラメータ
Biso mean: 24.8 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-3.4509 Å2
0 Å2
0 Å2
2-
-
-0.1109 Å2
0 Å2
3-
-
-
3.5618 Å2
Refine analyze
Luzzati coordinate error obs: 0.175 Å
精密化ステップ
サイクル: LAST / 解像度: 1.91→40.62 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1853
0
24
211
2088
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
1943
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
0.8
2619
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
951
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
63
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
282
HARMONIC
5
X-RAY DIFFRACTION
t_it
1943
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
2.63
X-RAY DIFFRACTION
t_other_torsion
2.91
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
246
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
6
HARMONIC
1
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
2536
SEMIHARMONIC
4
LS精密化 シェル
解像度: 1.91→2.03 Å / Total num. of bins used: 9
Rfactor
反射数
%反射
Rfree
0.2347
148
5.25 %
Rwork
0.1765
2672
-
all
0.1797
2820
-
obs
-
-
99.23 %
精密化 TLS
手法: refined / Origin x: -2.5892 Å / Origin y: -23.6398 Å / Origin z: -15.2463 Å