解像度: 1.7→30 Å / Cor.coef. Fo:Fc: 0.963 / Cor.coef. Fo:Fc free: 0.952 / SU B: 4.773 / SU ML: 0.072 / 交差検証法: THROUGHOUT / ESU R: 0.106 / ESU R Free: 0.106 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.21749
1507
5.1 %
RANDOM
Rwork
0.18043
-
-
-
obs
0.18222
28239
99.24 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 31.695 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.84 Å2
0.42 Å2
-0 Å2
2-
-
0.84 Å2
-0 Å2
3-
-
-
-1.25 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.7→30 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1923
0
47
205
2175
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.02
0.022
2065
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1465
X-RAY DIFFRACTION
r_angle_refined_deg
1.86
2.005
2797
X-RAY DIFFRACTION
r_angle_other_deg
1.02
3
3592
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.808
5
254
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.095
24.835
91
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.153
15
378
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
18.39
15
9
X-RAY DIFFRACTION
r_chiral_restr
0.111
0.2
293
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.021
2247
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
397
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.993
1.5
1226
X-RAY DIFFRACTION
r_mcbond_other
0.306
1.5
485
X-RAY DIFFRACTION
r_mcangle_it
1.701
2
1988
X-RAY DIFFRACTION
r_scbond_it
2.673
3
839
X-RAY DIFFRACTION
r_scangle_it
4.149
4.5
802
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.698→1.742 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.257
107
-
Rwork
0.234
2020
-
obs
-
-
97.61 %
精密化 TLS
手法: refined / Origin x: 22.7624 Å / Origin y: -10.6049 Å / Origin z: 19.8133 Å