解像度: 1.15→25.2 Å / Cor.coef. Fo:Fc: 0.981 / Cor.coef. Fo:Fc free: 0.974 / SU B: 0.971 / SU ML: 0.02 / Isotropic thermal model: Isotropic with TLS / 交差検証法: THROUGHOUT / ESU R Free: 0.031 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.15428
8352
5 %
RANDOM
Rwork
0.12807
-
-
-
obs
0.12937
165967
99.3 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 15.59 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.03 Å2
0 Å2
-0.46 Å2
2-
-
-0.17 Å2
0 Å2
3-
-
-
1.11 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.15→25.2 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3808
0
36
669
4513
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.007
0.022
4043
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.431
1.943
5523
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.94
5
499
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
32.841
24.252
214
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
10.661
15
632
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.271
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.099
0.2
572
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.021
3213
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.379
1.5
2386
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.985
2
3856
X-RAY DIFFRACTION
r_scbond_it
2.963
3
1657
X-RAY DIFFRACTION
r_scangle_it
4.21
4.5
1653
X-RAY DIFFRACTION
r_rigid_bond_restr
1.422
3
4043
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.15→1.212 Å / Total num. of bins used: 10
Rfactor
反射数
%反射
Rfree
0.235
1242
-
Rwork
0.216
22871
-
obs
-
24113
99.31 %
精密化 TLS
手法: refined / Origin x: -29.3385 Å / Origin y: 87.8597 Å / Origin z: 15.7032 Å