構造決定の手法: 分子置換 / 解像度: 2.3→67.52 Å / Cor.coef. Fo:Fc: 0.914 / Cor.coef. Fo:Fc free: 0.89 / SU B: 22.006 / SU ML: 0.247 / 交差検証法: THROUGHOUT / ESU R Free: 0.27 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.28135
797
5.1 %
RANDOM
Rwork
0.24535
-
-
-
obs
0.24715
14932
97.06 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 47.94 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.16 Å2
0 Å2
0 Å2
2-
-
0.78 Å2
0 Å2
3-
-
-
-0.94 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.3→67.52 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2406
0
17
35
2458
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.022
2484
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1749
X-RAY DIFFRACTION
r_angle_refined_deg
1.238
1.977
3356
X-RAY DIFFRACTION
r_angle_other_deg
0.846
3
4238
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.104
5
296
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.535
23.097
113
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.305
15
438
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
11.693
15
19
X-RAY DIFFRACTION
r_chiral_restr
0.068
0.2
359
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.021
2713
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
522
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.414
1.5
1489
X-RAY DIFFRACTION
r_mcbond_other
0.067
1.5
600
X-RAY DIFFRACTION
r_mcangle_it
0.779
2
2399
X-RAY DIFFRACTION
r_scbond_it
0.981
3
995
X-RAY DIFFRACTION
r_scangle_it
1.591
4.5
957
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.3→2.36 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.314
73
-
Rwork
0.281
1094
-
obs
-
-
99.15 %
精密化 TLS
手法: refined / Origin x: -5.128 Å / Origin y: 9.6421 Å / Origin z: -24.6291 Å