タイプ: MAR scanner 345 mm plate / 検出器: IMAGE PLATE / 日付: 2009年1月9日 / 詳細: mirrors
放射
モノクロメーター: Graphite / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.54 Å / 相対比: 1
反射
解像度: 2.7→15.4 Å / Num. obs: 426 / % possible obs: 100 % / Observed criterion σ(I): 3 / 冗長度: 8.71 % / Biso Wilson estimate: 65 Å2 / Rmerge(I) obs: 0.0766 / Rsym value: 0.0635 / Net I/σ(I): 4.3
反射 シェル
解像度: 2.7→2.8 Å / 冗長度: 8.27 % / Rmerge(I) obs: 0.458 / Mean I/σ(I) obs: 1 / Num. unique all: 26 / Rsym value: 0.42 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
MAR345dtb
データ収集
PHASER
位相決定
REFMAC
5.2.0019
精密化
AUTOMAR
データ削減
SCALEPACK
データスケーリング
精密化
構造決定の手法: 分子置換 開始モデル: Z-type DNA tetranucleotide built using InsightII 解像度: 2.72→14.52 Å / Cor.coef. Fo:Fc: 0.954 / Cor.coef. Fo:Fc free: 0.949 / SU B: 17.621 / SU ML: 0.339 / 交差検証法: THROUGHOUT / ESU R Free: 0.503 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: THE DNA OLIGONUCLEOTIDE HAS SIX BASE PAIRS (D(CACGCG).D(CGCGTG)) AND FORMS THE Z-TYPE DOUBLE HELICAL STRUCTURE. THE STRUCTURE HAS STATISTICAL DIS-ORDER AND THE ASYMMETRIC UNIT CONTAINS A ...詳細: THE DNA OLIGONUCLEOTIDE HAS SIX BASE PAIRS (D(CACGCG).D(CGCGTG)) AND FORMS THE Z-TYPE DOUBLE HELICAL STRUCTURE. THE STRUCTURE HAS STATISTICAL DIS-ORDER AND THE ASYMMETRIC UNIT CONTAINS A TETRAMERIC DUPLEX WHICH COULD STAND FOR EITHER CPGPCPG/CPGPCPG OR CPAPCPG/CPGPTPG OR CPGPCPA/TPGPCPG. DUE TO DISORDER, THE TETRANUCLEOTIDE WAS CONSTRUCTED AS TPGPTPG/TPGPTPG IN WHICH THE C5 METHYL GROUP OF THYMINE WAS ASSIGNED OCCUPANCY OF 1/6 AND N2 OF GUANINE WAS ASSIGNED OCCUPANCY OF 5/6.
Rfactor
反射数
%反射
Selection details
Rfree
0.27738
24
5.7 %
RANDOM
Rwork
0.24474
-
-
-
obs
0.24724
394
100 %
-
all
-
394
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 42.419 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.23 Å2
0.12 Å2
0 Å2
2-
-
0.23 Å2
0 Å2
3-
-
-
-0.35 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.72→14.52 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
0
165
0
3
168
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.021
183
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
2.562
3
280
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
X-RAY DIFFRACTION
r_chiral_restr
0.114
0.2
31
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
88
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.278
0.2
72
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.322
0.2
95
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.32
0.2
5
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.357
0.2
24
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.236
0.2
2
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
1.448
3
283
X-RAY DIFFRACTION
r_scangle_it
2.523
4.5
280
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.721→2.789 Å / Rfactor Rfree error: 0 / Total num. of bins used: 20