構造決定の手法: 分子置換 / 解像度: 1.99→32.68 Å / Cor.coef. Fo:Fc: 0.949 / Cor.coef. Fo:Fc free: 0.922 / SU B: 7.753 / SU ML: 0.1 / 交差検証法: THROUGHOUT / ESU R Free: 0.148 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.24524
1556
5 %
RANDOM
Rwork
0.19677
-
-
-
all
0.19931
30966
-
-
obs
0.19931
29410
99.36 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 29.933 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.04 Å2
0 Å2
0.11 Å2
2-
-
0.04 Å2
0 Å2
3-
-
-
0.07 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.99→32.68 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2371
0
49
201
2621
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.022
2480
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.499
1.969
3369
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.635
5
307
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.343
24.312
109
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.225
15
393
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.907
15
12
X-RAY DIFFRACTION
r_chiral_restr
0.105
0.2
378
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
1895
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.792
1.5
1520
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.451
2
2459
X-RAY DIFFRACTION
r_scbond_it
2.27
3
960
X-RAY DIFFRACTION
r_scangle_it
3.485
4.5
909
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.99→2.038 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.285
112
-
Rwork
0.242
2123
-
obs
-
-
97.94 %
精密化 TLS
手法: refined / Origin x: -0.6732 Å / Origin y: 1.1353 Å / Origin z: -15.0934 Å