解像度: 1.51→32.63 Å / Cor.coef. Fo:Fc: 0.968 / Cor.coef. Fo:Fc free: 0.964 / SU B: 2.312 / SU ML: 0.043 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.069 / ESU R Free: 0.068 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : WITH TLS ADDED
Rfactor
反射数
%反射
Selection details
Rfree
0.18175
2258
5 %
RANDOM
Rwork
0.16213
-
-
-
obs
0.16314
42520
97.73 %
-
all
-
42520
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 15.843 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.33 Å2
0 Å2
0 Å2
2-
-
-0.39 Å2
0 Å2
3-
-
-
0.07 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.51→32.63 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2148
0
0
299
2447
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
2199
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1538
X-RAY DIFFRACTION
r_angle_refined_deg
1.511
1.968
2970
X-RAY DIFFRACTION
r_angle_other_deg
0.958
3
3712
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.083
5
283
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
31.156
22.871
101
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.242
15
362
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
12.899
15
22
X-RAY DIFFRACTION
r_chiral_restr
0.097
0.2
321
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.021
2506
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
479
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.902
1.5
1399
X-RAY DIFFRACTION
r_mcbond_other
0.268
1.5
577
X-RAY DIFFRACTION
r_mcangle_it
1.583
2
2222
X-RAY DIFFRACTION
r_scbond_it
2.787
3
800
X-RAY DIFFRACTION
r_scangle_it
4.563
4.5
747
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.51→1.549 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.23
133
-
Rwork
0.204
2776
-
obs
-
-
86.84 %
精密化 TLS
手法: refined / Origin x: 32.7038 Å / Origin y: 28.2688 Å / Origin z: 15.6932 Å