解像度: 1.404→19.26 Å / Cor.coef. Fo:Fc: 0.972 / Cor.coef. Fo:Fc free: 0.965 / Occupancy max: 1 / Occupancy min: 0.38 / SU B: 1.472 / SU ML: 0.027 / SU R Cruickshank DPI: 0.0534 / 交差検証法: THROUGHOUT / ESU R: 0.058 / ESU R Free: 0.051 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.17094
1495
5 %
RANDOM
Rwork
0.15082
-
-
-
obs
0.15182
28218
97.17 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 15.428 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.01 Å2
0 Å2
0 Å2
2-
-
0.01 Å2
0 Å2
3-
-
-
-0.01 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.404→19.26 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
951
0
34
193
1178
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.021
1052
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.39
1.924
1450
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.568
5
142
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
23.752
24.286
42
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
10.727
15
140
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.121
15
3
X-RAY DIFFRACTION
r_chiral_restr
0.087
0.2
166
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
800
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.207
3.5
655
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.506
50
1051
X-RAY DIFFRACTION
r_scbond_it
3.534
50
397
X-RAY DIFFRACTION
r_scangle_it
1.62
4.5
392
X-RAY DIFFRACTION
r_rigid_bond_restr
0.713
3
1052
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.404→1.44 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.314
83
-
Rwork
0.306
1558
-
obs
-
-
75.07 %
精密化 TLS
手法: refined / Origin x: -24.6204 Å / Origin y: -14.0436 Å / Origin z: 2.4772 Å