解像度: 2.3→2.42 Å / 冗長度: 14.6 % / Mean I/σ(I) obs: 3.3 / Num. unique all: 2426 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
Blu-Ice
データ収集
PHASER
位相決定
REFMAC
5.5.0109
精密化
XDS
データ削減
SCALA
データスケーリング
精密化
構造決定の手法: 分子置換 / 解像度: 2.3→19.85 Å / Cor.coef. Fo:Fc: 0.952 / Cor.coef. Fo:Fc free: 0.935 / SU B: 11.642 / SU ML: 0.14 / 交差検証法: THROUGHOUT / ESU R: 0.278 / ESU R Free: 0.206 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.22011
855
5.1 %
RANDOM
Rwork
0.17957
-
-
-
obs
0.18164
16049
99.69 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 30.53 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.04 Å2
0 Å2
0 Å2
2-
-
0.18 Å2
0 Å2
3-
-
-
-0.22 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.3→19.85 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2397
0
81
42
2520
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.021
0.022
2572
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.813
2.001
3495
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.267
5
312
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
36.461
23.684
114
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.646
15
418
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.929
15
17
X-RAY DIFFRACTION
r_chiral_restr
0.122
0.2
387
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.021
1939
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.919
1.5
1541
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.661
2
2486
X-RAY DIFFRACTION
r_scbond_it
2.693
3
1031
X-RAY DIFFRACTION
r_scangle_it
3.913
4.5
1005
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.3→2.359 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.219
63
-
Rwork
0.221
1151
-
obs
-
-
99.59 %
精密化 TLS
手法: refined / Origin x: 7.368 Å / Origin y: -5.637 Å / Origin z: -10.965 Å