ソフトウェア | 名称: REFMAC / バージョン: 5.3.0037 / 分類: 精密化 |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 2.83→45.39 Å / Cor.coef. Fo:Fc: 0.915 / Cor.coef. Fo:Fc free: 0.861 / SU B: 44.052 / SU ML: 0.385 / 交差検証法: THROUGHOUT / ESU R Free: 0.483 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.29049 | 299 | 4.9 % | RANDOM |
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Rwork | 0.22602 | - | - | - |
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obs | 0.22933 | 5831 | 91.63 % | - |
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溶媒の処理 | イオンプローブ半径: 1 Å / 減衰半径: 1 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso mean: 50.144 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -0.4 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 3.44 Å2 | 0 Å2 |
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3- | - | - | -3.04 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.83→45.39 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1804 | 0 | 28 | 0 | 1832 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.006 | 0.021 | 1879 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.027 | 1.973 | 2569 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg4.747 | 5 | 243 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg39.107 | 25.065 | 77 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg18.153 | 15 | 278 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg17.999 | 15 | 8 | X-RAY DIFFRACTION | r_chiral_restr0.062 | 0.2 | 297 | X-RAY DIFFRACTION | r_gen_planes_refined0.002 | 0.02 | 1423 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined0.187 | 0.2 | 799 | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined0.293 | 0.2 | 1291 | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.12 | 0.2 | 63 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.167 | 0.2 | 69 | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.053 | 0.2 | 1 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it0.205 | 1.5 | 1240 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it0.378 | 2 | 1949 | X-RAY DIFFRACTION | r_scbond_it0.447 | 3 | 702 | X-RAY DIFFRACTION | r_scangle_it0.776 | 4.5 | 620 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.83→2.906 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.421 | 18 | - |
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Rwork | 0.251 | 317 | - |
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obs | - | - | 71.58 % |
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精密化 TLS | 手法: refined / Origin x: -16.1191 Å / Origin y: -24.7626 Å / Origin z: -11.6831 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.069 Å2 | -0.0186 Å2 | -0.0028 Å2 | - | 0.1545 Å2 | -0.0086 Å2 | - | - | 0.0772 Å2 |
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L | 1.2302 °2 | 0.2696 °2 | -0.0121 °2 | - | 2.0551 °2 | -0.7454 °2 | - | - | 1.6015 °2 |
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S | -0.0735 Å ° | 0.0946 Å ° | 0.0211 Å ° | -0.2176 Å ° | 0.0704 Å ° | 0.05 Å ° | 0.0192 Å ° | -0.0511 Å ° | 0.003 Å ° |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Auth seq-ID |
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1 | X-RAY DIFFRACTION | 1 | A22 - 265 | 2 | X-RAY DIFFRACTION | 1 | A1 - 2 | | |
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