ソフトウェア | 名称 | バージョン | 分類 | NB |
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XSCALE | | データスケーリング | | PHASER | 2.1.4位相決定 | | REFMAC | | 精密化 | | PDB_EXTRACT | 3.1 | データ抽出 | | MxCuBE | | データ収集 | | XDS | | データ削減 | | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: 7RSA 解像度: 1.49→31.01 Å / Cor.coef. Fo:Fc: 0.965 / Cor.coef. Fo:Fc free: 0.946 / WRfactor Rfree: 0.2018 / WRfactor Rwork: 0.1634 / Occupancy max: 1 / Occupancy min: 0 / FOM work R set: 0.8727 / SU B: 3.166 / SU ML: 0.053 / SU R Cruickshank DPI: 0.0739 / SU Rfree: 0.0798 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.074 / ESU R Free: 0.08 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.20913 | 1825 | 5 % | RANDOM |
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Rwork | 0.16732 | - | - | - |
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all | 0.1694 | 38664 | - | - |
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obs | 0.16939 | 34661 | 100 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso max: 46.93 Å2 / Biso mean: 19.547 Å2 / Biso min: 2 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.28 Å2 | 0 Å2 | -0.72 Å2 |
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2- | - | 0.99 Å2 | 0 Å2 |
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3- | - | - | -1.35 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.49→31.01 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1904 | 0 | 10 | 249 | 2163 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.025 | 0.021 | 1995 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg2.244 | 1.935 | 2715 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.639 | 5 | 264 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg38.36 | 25.227 | 88 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg11.5 | 15 | 349 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg14.671 | 15 | 8 | X-RAY DIFFRACTION | r_chiral_restr0.148 | 0.2 | 298 | X-RAY DIFFRACTION | r_gen_planes_refined0.015 | 0.021 | 1502 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined | | | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined | | | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined | | | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined | | | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined | | | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it1.293 | 1.5 | 1269 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it2.027 | 2 | 2063 | X-RAY DIFFRACTION | r_scbond_it3.284 | 3 | 726 | X-RAY DIFFRACTION | r_scangle_it5.229 | 4.5 | 643 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.49→1.529 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.305 | 95 | - |
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Rwork | 0.249 | 1790 | - |
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all | - | 1885 | - |
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obs | - | - | 100 % |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 1.7033 | 0.0403 | -0.1081 | 0.6097 | 0.3525 | 2.3346 | 0.0401 | -0.201 | -0.0013 | 0.087 | -0.0064 | 0.039 | 0.0491 | 0.0474 | -0.0337 | 0.0611 | -0.0015 | 0.0286 | 0.0344 | -0.0026 | 0.1959 | 10.666 | 12.489 | 4.175 | 2 | 1.6956 | 0.0584 | 0.2431 | 0.5209 | 0.1927 | 1.6151 | 0.0173 | -0.3098 | 0.0873 | -0.0337 | 0.0203 | -0.0558 | 0.0653 | -0.0826 | -0.0376 | 0.0167 | -0.0032 | 0.0359 | 0.0771 | -0.0136 | 0.1627 | 30.9 | 9.749 | 26.708 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Auth seq-ID |
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1 | X-RAY DIFFRACTION | 1 | A1 - 124 | 2 | X-RAY DIFFRACTION | 2 | B1 - 124 | | |
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