Mass: 18.015 Da / Num. of mol.: 188 / Source method: isolated from a natural source / Formula: H2O
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Experimental details
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Experiment
Experiment
Method: X-RAY DIFFRACTION / Number of used crystals: 1
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Sample preparation
Crystal
Density Matthews: 2.36 Å3/Da / Density % sol: 47.78 %
Crystal grow
Temperature: 293 K / Method: vapor diffusion, hanging drop / pH: 7 Details: 1 ul of protein solution (15 mg/ml protein and 10mM UDP-Glucose) was mixed with 1 ul of reservoir (0.1M Succinic Acid, 11% Polyethylene glycol 3,350, 10% glycerol), pH 7.0, VAPOR DIFFUSION, ...Details: 1 ul of protein solution (15 mg/ml protein and 10mM UDP-Glucose) was mixed with 1 ul of reservoir (0.1M Succinic Acid, 11% Polyethylene glycol 3,350, 10% glycerol), pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Resolution: 2.1→2.18 Å / Redundancy: 3.5 % / Rmerge(I) obs: 0.479 / Mean I/σ(I) obs: 10.8 / % possible all: 96
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Processing
Software
Name
Version
Classification
HKL-2000
datacollection
PHENIX
modelbuilding
PHENIX
(phenix.refine: 1.6.1_351)
refinement
DENZO
datareduction
SCALEPACK
datascaling
PHENIX
phasing
Refinement
Method to determine structure: MOLECULAR REPLACEMENT Starting model: A SAD dataset was collected using Se-Met crystal. Initial structure determined in spacegroup C2221 with Gtf3 dimer. Resolution: 2.287→42.512 Å / SU ML: 0.37 / Isotropic thermal model: Anisotropic / σ(F): 1.34 / Phase error: 28.16 / Stereochemistry target values: ML
Rfactor
Num. reflection
% reflection
Rfree
0.2498
3217
5.09 %
Rwork
0.187
-
-
obs
0.1901
63229
95.69 %
all
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63229
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Solvent computation
Shrinkage radii: 0.9 Å / VDW probe radii: 1.11 Å / Solvent model: FLAT BULK SOLVENT MODEL / Bsol: 45.737 Å2 / ksol: 0.338 e/Å3
Displacement parameters
Baniso -1
Baniso -2
Baniso -3
1-
12.6213 Å2
-0 Å2
-0 Å2
2-
-
-5.2667 Å2
0 Å2
3-
-
-
-7.3547 Å2
Refinement step
Cycle: LAST / Resolution: 2.287→42.512 Å
Protein
Nucleic acid
Ligand
Solvent
Total
Num. atoms
10583
0
100
188
10871
Refine LS restraints
Refine-ID
Type
Dev ideal
Number
X-RAY DIFFRACTION
f_bond_d
0.008
10987
X-RAY DIFFRACTION
f_angle_d
1.145
14894
X-RAY DIFFRACTION
f_dihedral_angle_d
17.21
4090
X-RAY DIFFRACTION
f_chiral_restr
0.077
1637
X-RAY DIFFRACTION
f_plane_restr
0.005
1888
LS refinement shell
Resolution (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
2.287-2.3692
0.347
272
0.2594
5227
X-RAY DIFFRACTION
85
2.3692-2.4641
0.3349
302
0.2385
5590
X-RAY DIFFRACTION
90
2.4641-2.5762
0.3324
326
0.2345
5850
X-RAY DIFFRACTION
94
2.5762-2.712
0.3097
329
0.227
5922
X-RAY DIFFRACTION
96
2.712-2.8819
0.2942
314
0.2202
5981
X-RAY DIFFRACTION
96
2.8819-3.1044
0.3064
307
0.2227
6127
X-RAY DIFFRACTION
97
3.1044-3.4166
0.272
317
0.2028
6184
X-RAY DIFFRACTION
99
3.4166-3.9107
0.2273
354
0.1662
6253
X-RAY DIFFRACTION
99
3.9107-4.926
0.1991
329
0.1417
6321
X-RAY DIFFRACTION
100
4.926-42.5188
0.1946
367
0.1584
6557
X-RAY DIFFRACTION
100
Refinement TLS params.
Method: refined / Refine-ID: X-RAY DIFFRACTION
ID
L11 (°2)
L12 (°2)
L13 (°2)
L22 (°2)
L23 (°2)
L33 (°2)
S11 (Å °)
S12 (Å °)
S13 (Å °)
S21 (Å °)
S22 (Å °)
S23 (Å °)
S31 (Å °)
S32 (Å °)
S33 (Å °)
T11 (Å2)
T12 (Å2)
T13 (Å2)
T22 (Å2)
T23 (Å2)
T33 (Å2)
Origin x (Å)
Origin y (Å)
Origin z (Å)
1
0.3872
-0.1982
-0.1284
0.6585
-0.0411
0.4673
-0.0072
0.0158
-0.0248
0.0021
0.0987
0.1665
0.0122
-0.0571
0.2556
0.1849
-0.0058
0.0099
0.2544
0.0319
0.2555
-20.1978
11.8655
-35.7629
2
0.6955
-0.3221
0.3991
0.4889
-0.132
0.3739
0.0178
0.075
-0.0236
0.0544
0.0426
-0.0429
-0.0127
0.0924
0.1486
0.1837
0.0078
-0.0306
0.192
-0.0178
0.1781
18.1814
-10.7748
-32.9353
3
0.4396
-0.2362
0.1853
0.5331
-0.1079
0.2641
-0.0982
-0.1652
0.1435
0.433
0.0529
-0.1419
-0.1878
0.0091
0.0001
0.4425
0.0058
-0.0967
0.2146
-0.0668
0.2272
9.7447
19.1676
-10.6127
4
0.4544
-0.4027
0.0645
0.6507
-0.1732
0.3218
-0.089
-0.1686
-0.1988
0.2991
0.146
0.2468
0.0671
-0.1099
-0
0.3524
-0.0239
0.1018
0.2859
0.0772
0.3139
-14.9586
-18.1143
-12.3641
Refinement TLS group
ID
Refine-ID
Refine TLS-ID
Selection details
1
X-RAY DIFFRACTION
1
(CHAINAANDRESID0:329)
2
X-RAY DIFFRACTION
2
(CHAIN B AND RESID -1:329)
3
X-RAY DIFFRACTION
3
(CHAINCANDRESID0:330)
4
X-RAY DIFFRACTION
4
(CHAIN D AND RESID -1:329)
+
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