ソフトウェア 名称 バージョン 分類  REFMAC5.5.0110精密化  XDSデータ削減  XSCALEデータスケーリング      
精密化 構造決定の手法  :  分子置換 /  解像度  : 2.53→19.64 Å /  Cor.coef. Fo :Fc   : 0.932  /  Cor.coef. Fo :Fc  free  : 0.892  /  SU B  : 27.422  /  SU ML  : 0.273  /  交差検証法  : THROUGHOUT /  ESU R Free  : 0.316  /  立体化学のターゲット値  : MAXIMUM LIKELIHOOD /  詳細  : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor  反射数 %反射 Selection details  Rfree  0.2652  234  2 % RANDOM  Rwork  0.21623  - - -  obs 0.21722  11428  100 % - 
溶媒の処理 イオンプローブ半径  : 0.8 Å /  減衰半径  : 0.8 Å /  VDWプローブ半径  : 1.4 Å /  溶媒モデル  : MASK原子変位パラメータ Biso   mean  : 11.942 Å2 Baniso  -1 Baniso  -2 Baniso  -3 1- 6.44 Å2  -0 Å2  -0 Å2  2- - -4.23 Å2  0 Å2  3- - - -2.22 Å2  
精密化ステップ サイクル  : LAST /  解像度  : 2.53→19.64 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 2456  0  6  43  2505  
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.006 0.022 2502 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.023 1.993 3400 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg5.169 5 315 X-RAY DIFFRACTION r_dihedral_angle_2_deg35.54 26.538 104 X-RAY DIFFRACTION r_dihedral_angle_3_deg14.514 15 453 X-RAY DIFFRACTION r_dihedral_angle_4_deg6.224 15 6 X-RAY DIFFRACTION r_chiral_restr0.065 0.2 399 X-RAY DIFFRACTION r_gen_planes_refined0.003 0.021 1842 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.385 3 1593 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it0.673 3 2566 X-RAY DIFFRACTION r_scbond_it0.594 4 909 X-RAY DIFFRACTION r_scangle_it0.889 4 834 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded                                                                                                                              
LS精密化 シェル 解像度  : 2.529→2.594 Å /  Total num. of bins used  : 20 Rfactor  反射数 %反射  Rfree  0.294  16  -  Rwork  0.259  771  -  obs - - 100 % 
精密化 TLS 手法  : refined /  Refine-ID  : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11  (°2 )L12  (°2 )L13  (°2 )L22  (°2 )L23  (°2 )L33  (°2 )S11  (Å °)S12  (Å °)S13  (Å °)S21  (Å °)S22  (Å °)S23  (Å °)S31  (Å °)S32  (Å °)S33  (Å °)T11  (Å2 )T12  (Å2 )T13  (Å2 )T22  (Å2 )T23  (Å2 )T33  (Å2 )Origin x  (Å)Origin y  (Å)Origin z  (Å)1 2.4925 -0.3044 1.205 4.941 0.7406 6.5746 -0.0058 0.1097 -0.2647 -0.3607 -0.0184 -0.1393 0.2823 0.0382 0.0242 0.1192 0.0196 0.0349 0.1285 -0.0101 0.1453 -0.6053 -2.7291 -24.0716 2 2.8178 1.7331 1.4716 5.0503 -0.211 6.7853 0.1236 -0.1769 -0.0255 0.6386 -0.0673 -0.2527 -0.1593 0.0949 -0.0563 0.2048 0.0098 -0.0457 0.1512 -0.0083 0.2212 7.6996 2.3349 5.2258 3 1.5112 -1.3175 1.891 1.2515 -2.057 4.8387 -0.1106 0.0801 -0.1934 0.1205 -0.0591 -0.0044 0.1522 -0.2674 0.1697 0.5387 -0.0743 -0.0732 0.2405 -0.1177 0.5313 2.4155 -1.7892 -20.4311 4 0.4434 0.9476 0.8344 2.3547 0.6619 5.5886 0.0709 -0.0211 -0.0307 0.0535 -0.0558 -0.1021 0.1848 -0.0743 -0.0151 0.0346 0.0571 0.0263 0.1533 0.0029 0.242 2.8312 -0.2258 -13.603 
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A18 - 178 2 X-RAY DIFFRACTION 2 B23 - 178 3 X-RAY DIFFRACTION 3 A1 - 6 4 X-RAY DIFFRACTION 4 A - B 1 - 195