解像度: 2→28.3 Å / Cor.coef. Fo:Fc: 0.94 / Cor.coef. Fo:Fc free: 0.905 / SU B: 9.769 / SU ML: 0.125 / 交差検証法: THROUGHOUT / ESU R Free: 0.184 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.25347
1096
5.2 %
RANDOM
Rwork
0.20879
-
-
-
all
0.212
20110
-
-
obs
0.21102
20105
99.63 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 21.401 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.1 Å2
0 Å2
0 Å2
2-
-
-0.06 Å2
0 Å2
3-
-
-
-0.03 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→28.3 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2331
0
23
173
2527
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.007
0.022
2446
X-RAY DIFFRACTION
r_bond_other_d
0.007
0.02
1694
X-RAY DIFFRACTION
r_angle_refined_deg
1.285
1.977
3318
X-RAY DIFFRACTION
r_angle_other_deg
0.879
3
4100
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.625
5
287
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.703
23.025
119
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.678
15
419
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
20.71
15
18
X-RAY DIFFRACTION
r_chiral_restr
0.071
0.2
344
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
2702
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
523
X-RAY DIFFRACTION
r_nbd_refined
0.195
0.2
520
X-RAY DIFFRACTION
r_nbd_other
0.186
0.2
1805
X-RAY DIFFRACTION
r_nbtor_refined
0.176
0.2
1159
X-RAY DIFFRACTION
r_nbtor_other
0.079
0.2
1183
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.131
0.2
143
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.193
0.2
20
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.241
0.2
62
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.209
0.2
9
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
2.866
2.5
1865
X-RAY DIFFRACTION
r_mcbond_other
0.341
2.5
577
X-RAY DIFFRACTION
r_mcangle_it
3.183
5
2310
X-RAY DIFFRACTION
r_scbond_it
2.376
2.5
1281
X-RAY DIFFRACTION
r_scangle_it
3.279
5
1008
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2→2.108 Å / Total num. of bins used: 10
Rfactor
反射数
%反射
Rfree
0.323
128
-
Rwork
0.231
2874
-
obs
-
-
98.56 %
精密化 TLS
手法: refined / Origin x: 8.3108 Å / Origin y: -4.5397 Å / Origin z: -0.1512 Å