Mass: 18.015 Da / Num. of mol.: 30 / Source method: isolated from a natural source / Formula: H2O
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Experimental details
-
Experiment
Experiment
Method: X-RAY DIFFRACTION / Number of used crystals: 1
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Sample preparation
Crystal
Density Matthews: 2.43 Å3/Da / Density % sol: 49.36 %
Crystal grow
Temperature: 303 K / Method: vapor diffusion, hanging drop / pH: 5 Details: 0.1 M phosphate-citrate pH 5, 0.2 M NaCl, 16% PEG 8000, 1M Guanidium hydrochloride, VAPOR DIFFUSION, HANGING DROP, temperature 303K
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Data collection
Diffraction
ID
Mean temperature (K)
Crystal-ID
1
78
1
2
78
1
Diffraction source
Source
Site
Beamline
ID
Wavelength (Å)
SYNCHROTRON
APS
21-ID-G
1
0.97872
SYNCHROTRON
APS
21-ID-D
2
0.97915
Detector
Type
ID
Detector
Date
Details
RAYONIX MX-225
1
CCD
Apr 23, 2008
berylliumlenses
RAYONIX MX-225
2
CCD
Apr 23, 2008
Radiation
ID
Monochromator
Protocol
Monochromatic (M) / Laue (L)
Scattering type
Wavelength-ID
1
silicon
SINGLEWAVELENGTH
M
x-ray
1
2
SINGLEWAVELENGTH
M
x-ray
2
Radiation wavelength
ID
Wavelength (Å)
Relative weight
1
0.97872
1
2
0.97915
1
Reflection
Resolution: 2.6→29.5 Å / Num. all: 28160 / Num. obs: 28151 / % possible obs: 99.9 % / Redundancy: 8.1 % / Biso Wilson estimate: 42.1 Å2 / Rmerge(I) obs: 0.079 / Rsym value: 0.074 / Net I/σ(I): 19
Reflection shell
Resolution: 2.6→2.72 Å / Redundancy: 6 % / Rmerge(I) obs: 0.572 / Mean I/σ(I) obs: 3.2 / Num. unique all: 3331 / Rsym value: 0.522 / % possible all: 100
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Processing
Software
Name
Version
Classification
MD2-microdiffractometer
datacollection
SHARP
phasing
REFMAC
5.2.0019
refinement
XDS
datareduction
SCALA
datascaling
Refinement
Method to determine structure: SAD / Resolution: 2.6→29.14 Å / Cor.coef. Fo:Fc: 0.928 / Cor.coef. Fo:Fc free: 0.898 / SU B: 28.292 / SU ML: 0.279 / Cross valid method: THROUGHOUT / ESU R: 0.963 / ESU R Free: 0.363 / Stereochemistry target values: MAXIMUM LIKELIHOOD / Details: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
Num. reflection
% reflection
Selection details
Rfree
0.28883
1438
5.1 %
RANDOM
Rwork
0.24132
-
-
-
all
0.24371
28151
-
-
obs
0.24371
26710
99.96 %
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Solvent computation
Ion probe radii: 0.8 Å / Shrinkage radii: 0.8 Å / VDW probe radii: 1.2 Å / Solvent model: MASK
Displacement parameters
Biso mean: 55.918 Å2
Baniso -1
Baniso -2
Baniso -3
1-
2.02 Å2
0 Å2
0 Å2
2-
-
2.02 Å2
0 Å2
3-
-
-
-4.04 Å2
Refinement step
Cycle: LAST / Resolution: 2.6→29.14 Å
Protein
Nucleic acid
Ligand
Solvent
Total
Num. atoms
5967
0
15
30
6012
Refine LS restraints
Refine-ID
Type
Dev ideal
Dev ideal target
Number
X-RAY DIFFRACTION
r_bond_refined_d
0.011
0.022
6092
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
4314
X-RAY DIFFRACTION
r_angle_refined_deg
1.203
1.98
8241
X-RAY DIFFRACTION
r_angle_other_deg
0.89
3.001
10376
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.538
5
722
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.326
22.822
326
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.444
15
1102
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
18.828
15
81
X-RAY DIFFRACTION
r_chiral_restr
0.067
0.2
906
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
6728
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
1297
X-RAY DIFFRACTION
r_nbd_refined
0.226
0.2
1527
X-RAY DIFFRACTION
r_nbd_other
0.185
0.2
4572
X-RAY DIFFRACTION
r_nbtor_refined
0.179
0.2
3020
X-RAY DIFFRACTION
r_nbtor_other
0.085
0.2
3361
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.15
0.2
148
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.202
0.2
39
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.263
0.2
86
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.16
0.2
7
X-RAY DIFFRACTION
r_mcbond_it
0.522
1.5
4780
X-RAY DIFFRACTION
r_mcbond_other
0.086
1.5
1453
X-RAY DIFFRACTION
r_mcangle_it
0.58
2
5886
X-RAY DIFFRACTION
r_scbond_it
0.968
3
2805
X-RAY DIFFRACTION
r_scangle_it
1.464
4.5
2355
Refine LS restraints NCS
Dom-ID: 1 / Auth asym-ID: B / Refine-ID: X-RAY DIFFRACTION
Ens-ID
Number
Type
Rms dev position (Å)
Weight position
1
3747
mediumpositional
0.56
0.5
2
1283
mediumpositional
0.68
0.5
1
3747
mediumthermal
0.44
2
2
1283
mediumthermal
0.44
2
LS refinement shell
Resolution: 2.6→2.667 Å / Total num. of bins used: 20
Rfactor
Num. reflection
% reflection
Rfree
0.451
93
-
Rwork
0.366
1897
-
obs
-
1897
100 %
Refinement TLS params.
Method: refined / Refine-ID: X-RAY DIFFRACTION
ID
L11 (°2)
L12 (°2)
L13 (°2)
L22 (°2)
L23 (°2)
L33 (°2)
S11 (Å °)
S12 (Å °)
S13 (Å °)
S21 (Å °)
S22 (Å °)
S23 (Å °)
S31 (Å °)
S32 (Å °)
S33 (Å °)
T11 (Å2)
T12 (Å2)
T13 (Å2)
T22 (Å2)
T23 (Å2)
T33 (Å2)
Origin x (Å)
Origin y (Å)
Origin z (Å)
1
2.9583
-0.2517
1.6331
1.167
-0.3077
0.9264
0.3108
0.1228
-0.4477
0.4169
-0.0102
-0.2431
0.0472
-0.0382
-0.3006
0.0868
-0.0745
-0.1294
0.0277
-0.0727
-0.0362
33.423
54.463
30.655
2
1.9926
-1.2413
-0.5037
1.0752
0.0944
0.2866
-0.535
-1.1316
0.3841
0.2499
0.4697
-0.4251
-0.0756
0.2088
0.0653
-0.0276
-0.0041
0.0017
0.0273
-0.019
-0.0119
51.724
43.316
25.416
3
3.0438
-0.6794
-0.5708
1.515
0.6801
5.0031
0.2346
0.4122
0.0134
-0.2364
-0.079
-0.2041
0.2031
0.7726
-0.1556
0.1147
-0.0004
0.1592
-0.0019
-0.0633
-0.0642
56.654
86.921
11.267
4
1.5646
-0.1092
0.2353
3.7517
-0.6236
2.5176
0.1448
-0.143
-0.1504
-0.0835
-0.0435
-0.7168
0.0316
0.9569
-0.1013
-0.0344
0.025
0.0292
-0.0241
-0.0348
-0.0458
76.906
76.506
13.481
Refinement TLS group
ID
Refine-ID
Refine TLS-ID
Auth asym-ID
Auth seq-ID
1
X-RAY DIFFRACTION
1
A
4 - 280
2
X-RAY DIFFRACTION
2
A
281 - 378
3
X-RAY DIFFRACTION
3
B
4 - 280
4
X-RAY DIFFRACTION
4
B
281 - 378
+
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