温度: 291 K / 手法: 蒸気拡散法, シッティングドロップ法 / pH: 7.5 詳細: 2.0M ammonium sulfate, 0.2M sodium chloride, 0.1M HEPES. 1:100 (w/w) papain and GMPPNP were also added. Please note: mass spectral analysis of TEV protease digest prior to crystallization ...詳細: 2.0M ammonium sulfate, 0.2M sodium chloride, 0.1M HEPES. 1:100 (w/w) papain and GMPPNP were also added. Please note: mass spectral analysis of TEV protease digest prior to crystallization suggested that removal of the His-tag was incomplete even after 2 days. However, without TEV protease treatment no crystals were obtained using otherwise identical crystallization conditions. Also note the presence of papain in the crystallization drop., pH 7.5, vapor diffusion, sitting drop, temperature 291K
解像度: 1.4→22.84 Å / Cor.coef. Fo:Fc: 0.969 / Cor.coef. Fo:Fc free: 0.963 / WRfactor Rfree: 0.182 / WRfactor Rwork: 0.155 / SU B: 1.644 / SU ML: 0.03 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.063 / ESU R Free: 0.056 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : WITH TLS ADDED. ARP/WARP, COOT and the MOLPROBITY server were also used during refinement.
Rfactor
反射数
%反射
Selection details
Rfree
0.181
1811
4.97 %
RANDOM
Rwork
0.154
-
-
-
obs
0.155
36436
99.956 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 14.63 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.282 Å2
0 Å2
0 Å2
2-
-
-0.282 Å2
0 Å2
3-
-
-
0.563 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.4→22.84 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1516
0
42
85
1643
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.022
1600
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1066
X-RAY DIFFRACTION
r_angle_refined_deg
1.515
1.963
2188
X-RAY DIFFRACTION
r_angle_other_deg
0.941
3
2607
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.517
5
201
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.24
24.444
81
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.149
15
275
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
7.143
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.1
0.2
234
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
1789
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
340
X-RAY DIFFRACTION
r_mcbond_it
1.263
1.5
931
X-RAY DIFFRACTION
r_mcbond_other
0.407
1.5
373
X-RAY DIFFRACTION
r_mcangle_it
1.918
2
1520
X-RAY DIFFRACTION
r_scbond_it
3.197
3
669
X-RAY DIFFRACTION
r_scangle_it
4.536
4.5
657
X-RAY DIFFRACTION
r_rigid_bond_restr
1.169
3
2666
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Num. reflection all
% reflection obs (%)
1.4-1.436
0.209
122
0.183
2532
2654
100
1.436-1.475
0.204
136
0.154
2470
2607
99.962
1.475-1.518
0.197
126
0.146
2435
2562
99.961
1.518-1.565
0.162
127
0.125
2336
2463
100
1.565-1.616
0.181
105
0.122
2279
2384
100
1.616-1.672
0.155
114
0.122
2209
2323
100
1.672-1.735
0.162
100
0.123
2164
2265
99.956
1.735-1.805
0.169
116
0.128
2008
2124
100
1.805-1.885
0.165
107
0.13
1921
2028
100
1.885-1.976
0.171
106
0.139
1868
1974
100
1.976-2.082
0.173
109
0.136
1812
1921
100
2.082-2.207
0.156
88
0.131
1677
1765
100
2.207-2.358
0.178
88
0.141
1574
1662
100
2.358-2.545
0.19
87
0.155
1506
1593
100
2.545-2.784
0.199
58
0.157
1380
1438
100
2.784-3.107
0.175
68
0.169
1237
1305
100
3.107-3.577
0.161
43
0.171
1099
1142
100
3.577-4.354
0.173
55
0.161
935
991
99.899
4.354-6.049
0.214
37
0.177
747
784
100
6.049-22.84
0.264
19
0.238
436
467
97.43
精密化 TLS
手法: refined / Origin x: 26.1668 Å / Origin y: 11.7144 Å / Origin z: 26.7548 Å