温度: 298 K / 手法: 蒸気拡散法, ハンギングドロップ法 / pH: 7 詳細: 2 microliters 24.44 mg/ml protein soln. [in 25 mM HEPES (pH 7.0), 500 mM NaCl, 0.025% Na-azide, 5% glycerol, 0.01 mM ZnCl2, 10 mM L-Met, 10 mM ATP] + 2 microliters well soln. [0.2 M K- ...詳細: 2 microliters 24.44 mg/ml protein soln. [in 25 mM HEPES (pH 7.0), 500 mM NaCl, 0.025% Na-azide, 5% glycerol, 0.01 mM ZnCl2, 10 mM L-Met, 10 mM ATP] + 2 microliters well soln. [0.2 M K-formate, 26% PEG 3350 and additives of 10 mM L-Met and 1 mM TCEP]; crystal cryoprotected by quick soak in mother liquor supplemented with 15% ethylene glycol, vapor diffusion, hanging drop, temperature 298K
解像度: 2→37.16 Å / Cor.coef. Fo:Fc: 0.967 / Cor.coef. Fo:Fc free: 0.945 / Occupancy max: 1 / Occupancy min: 0.4 / SU B: 8.108 / SU ML: 0.105 / 交差検証法: THROUGHOUT / ESU R: 0.157 / ESU R Free: 0.144 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. ATOM RECORD CONTAINS SUM OF TLS AND RESIDUAL B FACTORS. ANISOU RECORD CONTAINS SUM OF TLS AND RESIDUAL U FACTORS.
Rfactor
反射数
%反射
Selection details
Rfree
0.20871
2141
5.042 %
RANDOM
Rwork
0.16826
-
-
-
all
0.17
-
-
-
obs
0.17033
42461
99.7 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 38.029 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.2 Å2
0 Å2
0 Å2
2-
-
4.18 Å2
0 Å2
3-
-
-
-2.98 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→37.16 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4240
0
82
217
4539
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.01
0.022
4467
X-RAY DIFFRACTION
r_bond_other_d
0.003
0.02
3035
X-RAY DIFFRACTION
r_angle_refined_deg
1.197
1.961
6051
X-RAY DIFFRACTION
r_angle_other_deg
0.849
3.001
7371
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.815
5
539
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
36.248
24.058
207
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.446
15
757
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
11.738
15
24
X-RAY DIFFRACTION
r_chiral_restr
0.071
0.2
657
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.021
4893
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
907
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.66
4
2672
X-RAY DIFFRACTION
r_mcbond_other
0.561
4
1078
X-RAY DIFFRACTION
r_mcangle_it
2.397
6
4321
X-RAY DIFFRACTION
r_scbond_it
3.141
6
1795
X-RAY DIFFRACTION
r_scangle_it
4.297
10
1725
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20