ソフトウェア | 名称 | バージョン | 分類 |
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SBC-Collect | | データ収集 | HKL-3000 | | 位相決定 | MLPHARE | | 位相決定 | 直接法 | | モデル構築 | SHELXD | | 位相決定 | RESOLVE | | モデル構築 | Coot | | モデル構築 | REFMAC | 5.5.0054精密化 | HKL-3000 | | データ削減 | HKL-3000 | | データスケーリング | 直接法 | | 位相決定 | RESOLVE | | 位相決定 | |
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精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 2.15→50 Å / Cor.coef. Fo:Fc: 0.95 / Cor.coef. Fo:Fc free: 0.93 / SU B: 8.177 / SU ML: 0.099 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.167 / ESU R Free: 0.155 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.22695 | 1239 | 5.1 % | RANDOM |
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Rwork | 0.19111 | - | - | - |
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all | 0.1929 | 24267 | - | - |
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obs | 0.1929 | 24267 | 99.73 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso mean: 17.327 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 1.2 Å2 | 0.6 Å2 | 0 Å2 |
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2- | - | 1.2 Å2 | 0 Å2 |
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3- | - | - | -1.8 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.15→50 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1903 | 0 | 66 | 168 | 2137 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.015 | 0.022 | 2118 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.536 | 2.007 | 2891 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg5.562 | 5 | 269 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg29.945 | 24.023 | 87 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg15.328 | 15 | 362 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg13.108 | 15 | 16 | X-RAY DIFFRACTION | r_chiral_restr0.106 | 0.2 | 342 | X-RAY DIFFRACTION | r_gen_planes_refined0.007 | 0.021 | 1568 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined | | | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined | | | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined | | | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined | | | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined | | | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it0.829 | 1.5 | 1326 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it1.526 | 2 | 2160 | X-RAY DIFFRACTION | r_scbond_it2.356 | 3 | 792 | X-RAY DIFFRACTION | r_scangle_it3.921 | 4.5 | 731 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.148→2.203 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.209 | 87 | - |
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Rwork | 0.191 | 1663 | - |
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obs | - | 1750 | 99.38 % |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 5.6762 | 2.5843 | 0.4525 | 4.6954 | -0.6785 | 7.1757 | 0.1902 | -0.411 | 0.0661 | 0.1765 | -0.3069 | 0.2015 | 0.258 | -0.4054 | 0.1167 | 0.1995 | -0.1595 | 0.0942 | 0.1474 | -0.0829 | 0.1062 | 20.7556 | 46.6679 | 15.4591 | 2 | 3.9024 | 2.0168 | 0.5913 | 4.9694 | 1.2288 | 5.102 | 0.2076 | -0.0997 | -0.1509 | 0.1202 | -0.042 | -0.209 | 0.3311 | 0.0868 | -0.1656 | 0.2472 | -0.1378 | 0.0412 | 0.0939 | -0.0251 | 0.1294 | 27.0818 | 41.7342 | 6.0612 | 3 | 4.2961 | 0.205 | -1.9531 | 2.9792 | -1.4055 | 6.5538 | -0.0681 | -0.7856 | 0.0792 | 0.27 | -0.192 | -0.0659 | 0.0801 | 0.1934 | 0.2601 | 0.2998 | -0.1773 | 0.0204 | 0.2864 | -0.0859 | 0.1533 | 28.6869 | 48.07 | 23.926 | 4 | 6.4435 | 0.6653 | -0.2663 | 3.1525 | -0.2933 | 6.6164 | -0.2398 | 0.3676 | -0.1394 | -0.0739 | 0.1105 | 0.1502 | 0.1988 | -0.5357 | 0.1293 | 0.0216 | -0.074 | 0.0229 | 0.3728 | -0.0952 | 0.1152 | 14.2435 | 51.2979 | 39.6816 | 5 | 7.0991 | -0.0016 | -0.938 | 2.5306 | 0.3604 | 5.355 | -0.0154 | 0.2127 | 0.2319 | 0.0028 | 0.15 | -0.0947 | -0.241 | -0.4014 | -0.1346 | 0.0125 | -0.0004 | 0.0037 | 0.4125 | -0.0326 | 0.1278 | 13.4087 | 60.1753 | 48.2568 | 6 | 5.6938 | 0.3147 | 3.8837 | 1.1695 | 1.042 | 6.4384 | -0.0613 | 0.6878 | 0.0296 | -0.5078 | -0.0996 | -0.106 | 0.0065 | -0.1578 | 0.1609 | 0.2759 | -0.0322 | 0.059 | 0.6812 | -0.0343 | 0.301 | 19.532 | 56.3703 | 30.4303 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Auth seq-ID |
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1 | X-RAY DIFFRACTION | 1 | A-2 - 10 | 2 | X-RAY DIFFRACTION | 1 | A30 - 41 | 3 | X-RAY DIFFRACTION | 1 | A82 - 105 | 4 | X-RAY DIFFRACTION | 2 | A15 - 29 | 5 | X-RAY DIFFRACTION | 2 | A106 - 141 | 6 | X-RAY DIFFRACTION | 3 | A57 - 81 | 7 | X-RAY DIFFRACTION | 4 | B-1 - 10 | 8 | X-RAY DIFFRACTION | 4 | B30 - 41 | 9 | X-RAY DIFFRACTION | 4 | B82 - 105 | 10 | X-RAY DIFFRACTION | 5 | B15 - 29 | 11 | X-RAY DIFFRACTION | 5 | B106 - 141 | 12 | X-RAY DIFFRACTION | 6 | B56 - 81 | | | | | | | | | | | | |
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