ソフトウェア 名称 バージョン 分類 CBASSデータ収集 SHELXS位相決定 REFMAC5.2.0019精密化 HKL-2000データ削減 HKL-2000データスケーリング
精密化 構造決定の手法 : 単波長異常分散 / 解像度 : 2.2→55.22 Å / Cor.coef. Fo :Fc : 0.94 / Cor.coef. Fo :Fc free : 0.913 / SU B : 12.973 / SU ML : 0.162 / TLS residual ADP flag : LIKELY RESIDUAL / 交差検証法 : THROUGHOUT / ESU R : 0.289 / ESU R Free : 0.233 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.259 535 4.8 % RANDOM Rwork 0.19916 - - - obs 0.20195 10605 92.38 % - all - 11261 - -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 33.206 Å2 Baniso -1 Baniso -2 Baniso -3 1- 1.02 Å2 0.51 Å2 0 Å2 2- - 1.02 Å2 0 Å2 3- - - -1.53 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.2→55.22 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1575 0 0 51 1626
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.024 0.022 1611 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg2.102 1.965 2162 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg7.263 5 194 X-RAY DIFFRACTION r_dihedral_angle_2_deg34.744 23.014 73 X-RAY DIFFRACTION r_dihedral_angle_3_deg21.407 15 292 X-RAY DIFFRACTION r_dihedral_angle_4_deg20.797 15 11 X-RAY DIFFRACTION r_chiral_restr0.181 0.2 234 X-RAY DIFFRACTION r_gen_planes_refined0.009 0.02 1198 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refined0.251 0.2 722 X-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refined0.32 0.2 1073 X-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refined0.182 0.2 82 X-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refined0.218 0.2 42 X-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refined0.19 0.2 12 X-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it1.306 1.5 999 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it1.911 2 1553 X-RAY DIFFRACTION r_scbond_it3.373 3 695 X-RAY DIFFRACTION r_scangle_it5.154 4.5 609 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2.2→2.257 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.287 40 - Rwork 0.192 638 - obs - - 78.56 %
精密化 TLS 手法 : refined / Origin x : 15.699 Å / Origin y : 8.171 Å / Origin z : -14.643 Å11 12 13 21 22 23 31 32 33 T -0.015 Å2 -0.0414 Å2 -0.0103 Å2 - -0.1178 Å2 0.0123 Å2 - - -0.2094 Å2 L 0.7455 °2 1.2563 °2 -0.474 °2 - 3.9613 °2 0.0224 °2 - - 3.109 °2 S 0.0148 Å ° -0.0571 Å ° 0.0284 Å ° 0.1301 Å ° 0.0224 Å ° -0.2421 Å ° -0.122 Å ° 0.1912 Å ° -0.0373 Å °