解像度: 2.05→20 Å / Cor.coef. Fo:Fc: 0.962 / Cor.coef. Fo:Fc free: 0.933 / SU B: 14.988 / SU ML: 0.176 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.212 / ESU R Free: 0.197 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.Residues 287:298 have poor electron density. The electron density for residues 291:298 can be explained by these residues stemming from ...詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.Residues 287:298 have poor electron density. The electron density for residues 291:298 can be explained by these residues stemming from either Chain A or from Chain B. To indicate this ambiguity, residues 287:298 of Chain A and Chain B have been modeled with an occupancy of 0.5.
Rfactor
反射数
%反射
Selection details
Rfree
0.263
1861
5 %
RANDOM
Rwork
0.2
-
-
-
all
0.204
38566
-
-
obs
0.204
35359
96.61 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 36.783 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.13 Å2
2.51 Å2
0.5 Å2
2-
-
3.46 Å2
3.81 Å2
3-
-
-
-0.5 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.05→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4286
0
1
136
4423
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.022
4374
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
3938
X-RAY DIFFRACTION
r_angle_refined_deg
1.406
1.955
5898
X-RAY DIFFRACTION
r_angle_other_deg
0.803
3
9212
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.823
5
536
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.087
24.059
202
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.207
15
798
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.691
15
30
X-RAY DIFFRACTION
r_chiral_restr
0.08
0.2
652
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
4806
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
874
X-RAY DIFFRACTION
r_nbd_refined
0.213
0.2
865
X-RAY DIFFRACTION
r_nbd_other
0.187
0.2
3901
X-RAY DIFFRACTION
r_nbtor_refined
0.178
0.2
2054
X-RAY DIFFRACTION
r_nbtor_other
0.085
0.2
2467
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.174
0.2
174
X-RAY DIFFRACTION
r_xyhbond_nbd_other
0.001
0.2
1
X-RAY DIFFRACTION
r_metal_ion_refined
0.071
0.2
2
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.278
0.2
21
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.211
0.2
63
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.119
0.2
6
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
4.02
2.5
3487
X-RAY DIFFRACTION
r_mcbond_other
0.714
2.5
1086
X-RAY DIFFRACTION
r_mcangle_it
4.883
5
4376
X-RAY DIFFRACTION
r_scbond_it
3.67
2.5
1918
X-RAY DIFFRACTION
r_scangle_it
5.084
5
1522
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.054→2.096 Å / Total num. of bins used: 25
Rfactor
反射数
%反射
Rfree
0.382
81
-
Rwork
0.269
1729
-
obs
-
-
79.35 %
精密化 TLS
手法: refined / Origin x: -1.9642 Å / Origin y: -8.793 Å / Origin z: -3.9975 Å