プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.07176 Å / 相対比: 1
反射
解像度: 2.1→20 Å / Num. obs: 13057 / % possible obs: 99 % / 冗長度: 3 % / Rmerge(I) obs: 0.035 / Net I/σ(I): 19.3
反射 シェル
解像度: 2.1→2.15 Å / Rmerge(I) obs: 0.236 / Mean I/σ(I) obs: 4.7 / Num. unique all: 752 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
REFMAC
5.2.0005
精密化
XDS
データ削減
XDS
データスケーリング
SOLVE
位相決定
精密化
解像度: 2.1→20 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.944 / SU B: 8.084 / SU ML: 0.113 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.162 / ESU R Free: 0.147 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. Phases were derived after rigid body refinement using a model previously determined by MAD.
Rfactor
反射数
%反射
Selection details
Rfree
0.22
705
5.1 %
RANDOM
Rwork
0.19
-
-
-
obs
0.19288
13057
99.35 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 47.037 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.91 Å2
0.95 Å2
0 Å2
2-
-
1.91 Å2
0 Å2
3-
-
-
-2.86 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1149
0
29
56
1234
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.021
0.022
1216
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.714
1.984
1629
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.395
5
146
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
42.66
24.364
55
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.296
15
234
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.548
15
8
X-RAY DIFFRACTION
r_chiral_restr
0.124
0.2
185
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
865
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.225
0.2
598
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.293
0.2
843
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.12
0.2
65
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.193
0.2
34
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.151
0.2
11
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.961
1.5
761
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.526
2
1177
X-RAY DIFFRACTION
r_scbond_it
2.623
3
520
X-RAY DIFFRACTION
r_scangle_it
3.749
4.5
451
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.1→2.146 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.373
36
-
Rwork
0.266
783
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: 36.3663 Å / Origin y: -12.07 Å / Origin z: 14.9273 Å