解像度: 2.7→30 Å / Cor.coef. Fo:Fc: 0.929 / Cor.coef. Fo:Fc free: 0.86 / WRfactor Rfree: 0.261 / WRfactor Rwork: 0.189 / SU B: 28.773 / SU ML: 0.266 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 1.345 / ESU R Free: 0.37 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. Atomic temperature factors are residuals from TLS refinement. Programs coot, molprobity, scwrl have also been used in refinement.
Rfactor
反射数
%反射
Selection details
Rfree
0.274
726
3.7 %
thin shells
Rwork
0.202
-
-
-
all
0.205
-
-
-
obs
-
19837
97.2 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 22.038 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.1 Å2
0 Å2
0.73 Å2
2-
-
-0.34 Å2
0 Å2
3-
-
-
1.77 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.7→30 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4506
0
64
11
4581
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.022
4641
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.02
2982
X-RAY DIFFRACTION
r_angle_refined_deg
1.229
1.979
6300
X-RAY DIFFRACTION
r_angle_other_deg
0.839
3
7306
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.253
5
596
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.123
24.023
174
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.758
15
728
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.027
15
25
X-RAY DIFFRACTION
r_chiral_restr
0.069
0.2
761
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
5116
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
893
X-RAY DIFFRACTION
r_nbd_refined
0.203
0.2
859
X-RAY DIFFRACTION
r_nbd_other
0.184
0.2
2995
X-RAY DIFFRACTION
r_nbtor_refined
0.174
0.2
2176
X-RAY DIFFRACTION
r_nbtor_other
0.084
0.2
2585
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.144
0.2
98
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.157
0.2
15
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.209
0.2
30
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.185
0.2
6
X-RAY DIFFRACTION
r_mcbond_it
1.579
2
3135
X-RAY DIFFRACTION
r_mcbond_other
0.301
2
1228
X-RAY DIFFRACTION
r_mcangle_it
2.366
3
4809
X-RAY DIFFRACTION
r_scbond_it
1.498
2
1749
X-RAY DIFFRACTION
r_scangle_it
2.213
3
1491
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20