ENGINEERED RESIDUE IN CHAIN A, GLU 58 TO ALA ENGINEERED RESIDUE IN CHAIN A, LYS 59 TO ALA ...ENGINEERED RESIDUE IN CHAIN A, GLU 58 TO ALA ENGINEERED RESIDUE IN CHAIN A, LYS 59 TO ALA ENGINEERED RESIDUE IN CHAIN A, GLU 278 TO ALA ENGINEERED RESIDUE IN CHAIN A, GLU 289 TO ALA ENGINEERED RESIDUE IN CHAIN A, LYS 280 TO ALA ENGINEERED RESIDUE IN CHAIN B, GLU 58 TO ALA ENGINEERED RESIDUE IN CHAIN B, LYS 59 TO ALA ENGINEERED RESIDUE IN CHAIN B, GLU 278 TO ALA ENGINEERED RESIDUE IN CHAIN B, GLU 279 TO ALA ENGINEERED RESIDUE IN CHAIN B, LYS 280 TO ALA
Has protein modification
Y
配列の詳細
N TERMINAL GTENLYFQSM SEQUENCE DUE TO CLONING AND UNCLEAVED TAG AND MUTATIONS E58A K59A E278A E279A K280A
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.9795 Å / 相対比: 1
反射
解像度: 2.8→19.92 Å / Num. obs: 31699 / % possible obs: 99.7 % / Observed criterion σ(I): 1.6 / 冗長度: 5 % / Biso Wilson estimate: 94.76 Å2 / Rmerge(I) obs: 0.12 / Net I/σ(I): 8.4
反射 シェル
解像度: 2.8→2.95 Å / 冗長度: 5 % / Rmerge(I) obs: 1.06 / Mean I/σ(I) obs: 1.6 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
BUSTER
2.8.0
精密化
XDS
データ削減
SCALA
データスケーリング
SHARP
位相決定
精密化
構造決定の手法: 多重同系置換・異常分散 開始モデル: NONE 解像度: 2.8→29.73 Å / Cor.coef. Fo:Fc: 0.9211 / Cor.coef. Fo:Fc free: 0.8688 / 交差検証法: THROUGHOUT / σ(F): 0 詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. RESIDUE TYPES WITHOUT CCP4 ATOM TYPE IN LIBRARY=UNK. NUMBER OF ATOMS WITH PROPER CCP4 ATOM TYPE=6350. NUMBER WITH APPROX DEFAULT CCP4 ATOM TYPE=0. ...詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. RESIDUE TYPES WITHOUT CCP4 ATOM TYPE IN LIBRARY=UNK. NUMBER OF ATOMS WITH PROPER CCP4 ATOM TYPE=6350. NUMBER WITH APPROX DEFAULT CCP4 ATOM TYPE=0. NUMBER TREATED BY BAD NON-BONDED CONTACTS=2.
Rfactor
反射数
%反射
Selection details
Rfree
0.2553
1607
5.07 %
RANDOM
Rwork
0.2125
-
-
-
obs
0.2146
31694
-
-
原子変位パラメータ
Biso mean: 73.71 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.9749 Å2
0 Å2
0 Å2
2-
-
-2.6662 Å2
0 Å2
3-
-
-
3.641 Å2
Refine analyze
Luzzati coordinate error obs: 0.453 Å
精密化ステップ
サイクル: LAST / 解像度: 2.8→29.73 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
6249
0
6
82
6337
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
6418
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.07
8738
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
2868
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
117
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
979
HARMONIC
5
X-RAY DIFFRACTION
t_it
6418
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
0
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_omega_torsion
2.65
X-RAY DIFFRACTION
t_other_torsion
2.94
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
822
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
7133
SEMIHARMONIC
4
LS精密化 シェル
解像度: 2.8→2.89 Å / Total num. of bins used: 16
Rfactor
反射数
%反射
Rfree
0.2953
133
4.66 %
Rwork
0.2562
2724
-
all
0.2579
2857
-
精密化 TLS
手法: refined / Refine-ID: X-RAY DIFFRACTION
ID
L11 (°2)
L12 (°2)
L13 (°2)
L22 (°2)
L23 (°2)
L33 (°2)
S11 (Å °)
S12 (Å °)
S13 (Å °)
S21 (Å °)
S22 (Å °)
S23 (Å °)
S31 (Å °)
S32 (Å °)
S33 (Å °)
T11 (Å2)
T12 (Å2)
T13 (Å2)
T22 (Å2)
T23 (Å2)
T33 (Å2)
Origin x (Å)
Origin y (Å)
Origin z (Å)
1
1.7187
0.1387
0.2473
0.7315
-0.2203
2.5983
-0.1232
0.1451
-0.0085
-0.2194
0.1414
-0.1943
0.4789
0.0821
-0.0182
-0.063
-0.0483
0.0696
-0.3041
-0.011
-0.2141
47.3018
57.4346
63.673
2
1.2417
0.2744
0.884
1.4201
0.0532
2.1129
0.0305
-0.0671
0.0497
0.0087
-0.1083
-0.214
0.1223
0.0701
0.0779
-0.1562
0.0493
0.0124
-0.223
0.0615
-0.1764
61.0563
66.2527
98.0487
精密化 TLSグループ
ID
Refine-ID
Refine TLS-ID
Selection details
1
X-RAY DIFFRACTION
1
CHAIN A AND (RESID -9 - 40 AND RESID 41 - 59 AND RESID 66 - 114 AND RESID 117 - 275 AND 282 - 343 AND RESID 372 - 488)
2
X-RAY DIFFRACTION
2
CHAIN B AND (RESID -2 - 40 AND RESID 41 - 274 AND RESID 282 - 343 AND RESID 373 - 487)