ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.2.0019精密化 | SBC-Collect | | データ収集 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | HKL-3000 | | 位相決定 | |
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精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 1.8→52.7 Å / Cor.coef. Fo:Fc: 0.94 / Cor.coef. Fo:Fc free: 0.929 / SU B: 6.829 / SU ML: 0.112 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.161 / ESU R Free: 0.144 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.25471 | 1653 | 5.1 % | RANDOM |
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Rwork | 0.22384 | - | - | - |
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all | 0.22547 | 30769 | - | - |
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obs | 0.22547 | 30769 | 98.38 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso mean: 32.631 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 1.02 Å2 | 0 Å2 | 0.86 Å2 |
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2- | - | -1.12 Å2 | 0 Å2 |
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3- | - | - | 0.47 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.042 Å | 0.04 Å |
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Luzzati d res low | - | 6 Å |
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Luzzati sigma a | 0.5 Å | 0.35 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.8→52.7 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2776 | 0 | 0 | 144 | 2920 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.014 | 0.022 | 2820 | X-RAY DIFFRACTION | r_angle_refined_deg1.509 | 1.975 | 3794 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.376 | 5 | 349 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg29.63 | 22.96 | 125 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg14.55 | 15 | 534 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg17.421 | 15 | 28 | X-RAY DIFFRACTION | r_chiral_restr0.108 | 0.2 | 430 | X-RAY DIFFRACTION | r_gen_planes_refined0.006 | 0.02 | 2078 | X-RAY DIFFRACTION | r_nbd_refined0.217 | 0.2 | 1299 | X-RAY DIFFRACTION | r_nbtor_refined0.304 | 0.2 | 1949 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.144 | 0.2 | 156 | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.175 | 0.2 | 50 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.112 | 0.2 | 11 | X-RAY DIFFRACTION | r_mcbond_it1.083 | 1.5 | 1809 | X-RAY DIFFRACTION | r_mcangle_it1.524 | 2 | 2816 | X-RAY DIFFRACTION | r_scbond_it2.43 | 3 | 1143 | X-RAY DIFFRACTION | r_scangle_it3.281 | 4.5 | 978 | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.8→1.845 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.384 | 120 | - |
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Rwork | 0.279 | 2089 | - |
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obs | - | 2209 | 94.12 % |
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精密化 TLS | 手法: refined / Origin x: 34.103 Å / Origin y: 29.364 Å / Origin z: 15.845 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | -0.0683 Å2 | -0.0075 Å2 | -0.0252 Å2 | - | -0.0514 Å2 | 0.0193 Å2 | - | - | -0.0268 Å2 |
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L | 0.5242 °2 | -0.2424 °2 | -0.2081 °2 | - | 1.6528 °2 | 1.317 °2 | - | - | 1.2968 °2 |
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S | -0.0517 Å ° | -0.0136 Å ° | 0.0304 Å ° | 0.0673 Å ° | -0.0193 Å ° | 0.0622 Å ° | -0.0439 Å ° | 0.0456 Å ° | 0.0711 Å ° |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA-2 - 50 | 1 - 53 | 2 | X-RAY DIFFRACTION | 1 | AA51 - 95 | 54 - 98 | 3 | X-RAY DIFFRACTION | 1 | AA96 - 135 | 99 - 138 | 4 | X-RAY DIFFRACTION | 1 | AA136 - 175 | 139 - 178 | 5 | X-RAY DIFFRACTION | 1 | BB3 - 50 | 6 - 53 | 6 | X-RAY DIFFRACTION | 1 | BB51 - 95 | 54 - 98 | 7 | X-RAY DIFFRACTION | 1 | BB96 - 135 | 99 - 138 | 8 | X-RAY DIFFRACTION | 1 | BB136 - 175 | 139 - 178 | | | | | | | | | | | | | | | | |
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