ENGINEERED RESIDUE IN CHAIN A, THR 232 TO ASP ENGINEERED RESIDUE IN CHAIN B, THR 232 TO ASP ...ENGINEERED RESIDUE IN CHAIN A, THR 232 TO ASP ENGINEERED RESIDUE IN CHAIN B, THR 232 TO ASP ENGINEERED RESIDUE IN CHAIN C, THR 232 TO ASP ENGINEERED RESIDUE IN CHAIN D, THR 232 TO ASP ENGINEERED RESIDUE IN CHAIN E, THR 232 TO ASP ENGINEERED RESIDUE IN CHAIN F, THR 232 TO ASP
解像度: 2.65→40 Å / Cor.coef. Fo:Fc: 0.915 / Cor.coef. Fo:Fc free: 0.891 / SU B: 31.663 / SU ML: 0.321 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R Free: 0.383 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.
Rfactor
反射数
%反射
Selection details
Rfree
0.272
3388
5.1 %
RANDOM
Rwork
0.24
-
-
-
obs
0.242
68033
98.4 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK