| ソフトウェア | | 名称 | バージョン | 分類 |
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| CNS | 1.1 | 精密化 | | DENZO | | データ削減 | | SCALEPACK | | データスケーリング | | SHARP | | 位相決定 |
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| 精密化 | 構造決定の手法: 単波長異常分散, 多重同系置換 解像度: 2.5→19.59 Å / Rfactor Rfree error: 0.012 / Data cutoff high absF: 2260688.99 / Data cutoff low absF: 0 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 / 立体化学のターゲット値: Engh & Huber / 詳細: BULK SOLVENT MODEL USED
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.258 | 455 | 5.1 % | RANDOM |
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| Rwork | 0.208 | - | - | - |
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| obs | 0.208 | 8995 | 95.3 % | - |
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| all | - | 9439 | - | - |
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| 溶媒の処理 | 溶媒モデル: FLAT MODEL / Bsol: 40.8891 Å2 / ksol: 0.342283 e/Å3 |
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| 原子変位パラメータ | Biso mean: 54.2 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 6.32 Å2 | 9.72 Å2 | 0 Å2 |
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| 2- | - | 6.32 Å2 | 0 Å2 |
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| 3- | - | - | -12.64 Å2 |
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| Refine analyze | | Free | Obs |
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| Luzzati coordinate error | 0.41 Å | 0.3 Å |
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| Luzzati d res low | - | 6 Å |
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| Luzzati sigma a | 0.52 Å | 0.44 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.5→19.59 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 2061 | 0 | 26 | 143 | 2230 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | c_bond_d| 0.007 | | | X-RAY DIFFRACTION | c_angle_deg| 1.1 | | | X-RAY DIFFRACTION | c_dihedral_angle_d| 22.6 | | | X-RAY DIFFRACTION | c_improper_angle_d| 0.68 | | | X-RAY DIFFRACTION | c_mcbond_it| 1.53 | 2 | | X-RAY DIFFRACTION | c_mcangle_it| 2.7 | 2.5 | | X-RAY DIFFRACTION | c_scbond_it| 2.06 | 2.5 | | X-RAY DIFFRACTION | c_scangle_it| 3.3 | 3 | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.5→2.66 Å / Rfactor Rfree error: 0.049 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.38 | 61 | 4.4 % |
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| Rwork | 0.349 | 1327 | - |
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| obs | - | - | 88.8 % |
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
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| X-RAY DIFFRACTION | 1 | PROTEIN_REP.PARAMPROTEIN.TOP| X-RAY DIFFRACTION | 2 | NUC.PARAMNUC.TOP| X-RAY DIFFRACTION | 3 | WATER_REP.PARAMWATER.TOP| X-RAY DIFFRACTION | 4 | ION.PARAMION.TOP| X-RAY DIFFRACTION | 5 | SAH.PARAM| SAH.TOP | | | | | | | | | |
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| 精密化 | *PLUS 最高解像度: 2.5 Å / 最低解像度: 20 Å / % reflection Rfree: 5 % / Rfactor Rfree: 0.26 / Rfactor Rwork: 0.21 |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | c_angle_deg| 1.1 | | X-RAY DIFFRACTION | c_dihedral_angle_d | | X-RAY DIFFRACTION | c_dihedral_angle_deg| 22.6 | | X-RAY DIFFRACTION | c_improper_angle_d | | X-RAY DIFFRACTION | c_improper_angle_deg| 0.68 | | | | | |
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| LS精密化 シェル | *PLUS Rfactor Rwork: 0.35 |
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