ソフトウェア | 名称 | バージョン | 分類 |
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SOLVE | | 位相決定 | X-PLOR | 3.843 | 精密化 | DENZO | | データ削減 | SCALEPACK | | データスケーリング |
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精密化 | Rfactor Rfree error: 0.005 / 最高解像度: 2.9 Å / Data cutoff high absF: 10000000 / Data cutoff low absF: 0 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 / 詳細: BULK SOLVENT MODEL USED
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.273 | 3516 | 9.9 % | RANDOM |
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Rwork | 0.19 | - | - | - |
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obs | 0.19 | 35558 | 87.3 % | - |
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原子変位パラメータ | Biso mean: 24.2 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0 Å2 | 0 Å2 |
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3- | - | - | 0 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.44 Å | 0.28 Å |
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Luzzati d res low | - | 5 Å |
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Luzzati sigma a | 0.53 Å | 0.35 Å |
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精密化ステップ | サイクル: LAST / 最高解像度: 2.9 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 4980 | 0 | 0 | 0 | 4980 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.007 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg1.2 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d23.3 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d1.02 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it2.95 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it4.65 | 2 | X-RAY DIFFRACTION | x_scbond_it4.6 | 2 | X-RAY DIFFRACTION | x_scangle_it6.45 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.9→3.08 Å / Rfactor Rfree error: 0.014 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.296 | 430 | 9.6 % |
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Rwork | 0.245 | 4029 | - |
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obs | - | - | 65.8 % |
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ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.843 / 分類: refinement |
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精密化 | *PLUS 最低解像度: 20 Å / σ(F): 0 / % reflection Rfree: 9.9 % / Rfactor obs: 0.19 / Rfactor Rwork: 0.19 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS Biso mean: 24.2 Å2 |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_angle_deg1.2 | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg23.3 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg1.02 | | X-RAY DIFFRACTION | x_mcbond_it | 1.5 | X-RAY DIFFRACTION | x_scbond_it | 2 | X-RAY DIFFRACTION | x_mcangle_it | 2 | X-RAY DIFFRACTION | x_scangle_it | 2.5 | | | | | | | | | |
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LS精密化 シェル | *PLUS Rfactor Rfree: 0.296 / % reflection Rfree: 9.6 % / Rfactor Rwork: 0.245 |
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