ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.1.24精密化 | HKL-2000 | | データ削減 | SCALEPACK | | データスケーリング | CNS | | 位相決定 | |
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精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 2.1→35.14 Å / Cor.coef. Fo:Fc: 0.956 / Cor.coef. Fo:Fc free: 0.94 / SU B: 3.627 / SU ML: 0.096 / 交差検証法: THROUGHOUT / σ(F): 2 / ESU R: 0.163 / ESU R Free: 0.156 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.23256 | 161 | 5.3 % | RANDOM |
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Rwork | 0.20332 | - | - | - |
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all | 0.20485 | 2907 | - | - |
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obs | 0.20485 | 2870 | 98.7 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 39.727 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -1.5 Å2 | -0.75 Å2 | 0 Å2 |
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2- | - | -1.5 Å2 | 0 Å2 |
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3- | - | - | 2.24 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.1→35.14 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 0 | 257 | 1 | 23 | 281 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.02 | 0.021 | 292 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg3.133 | 3 | 451 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_2_deg | | | X-RAY DIFFRACTION | r_chiral_restr0.12 | 0.2 | 36 | X-RAY DIFFRACTION | r_gen_planes_refined0.013 | 0.02 | 142 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined0.381 | 0.2 | 74 | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.187 | 0.2 | 11 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.113 | 0.2 | 20 | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.065 | 0.2 | 5 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_mcbond_it | | | X-RAY DIFFRACTION | r_mcangle_it | | | X-RAY DIFFRACTION | r_scbond_it | | | X-RAY DIFFRACTION | r_scangle_it | | | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.1→2.155 Å / Total num. of bins used: 20 / | Rfactor | 反射数 |
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Rfree | 0.258 | 16 |
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Rwork | 0.228 | 217 |
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