ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.1.24精密化 | DENZO | | データ削減 | CCP4 | (SCALA)データスケーリング | AMoRE | | 位相決定 | | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 1.37→25 Å / Cor.coef. Fo:Fc: 0.974 / Cor.coef. Fo:Fc free: 0.964 / SU B: 0.948 / SU ML: 0.038 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.058 / ESU R Free: 0.06 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.1797 | 1843 | 2 % | RANDOM |
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Rwork | 0.15256 | - | - | - |
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obs | 0.1531 | 90689 | 93.97 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 10.992 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 1.71 Å2 | 0.49 Å2 | -0.12 Å2 |
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2- | - | -0.95 Å2 | 0.03 Å2 |
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3- | - | - | -0.68 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.37→25 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 4437 | 0 | 74 | 589 | 5100 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.011 | 0.021 | 4627 | X-RAY DIFFRACTION | r_bond_other_d0.002 | 0.02 | 3996 | X-RAY DIFFRACTION | r_angle_refined_deg1.398 | 1.946 | 6260 | X-RAY DIFFRACTION | r_angle_other_deg0.801 | 3 | 9308 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.844 | 5 | 595 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg | | | X-RAY DIFFRACTION | r_chiral_restr0.083 | 0.2 | 686 | X-RAY DIFFRACTION | r_gen_planes_refined0.007 | 0.02 | 5251 | X-RAY DIFFRACTION | r_gen_planes_other0.004 | 0.02 | 961 | X-RAY DIFFRACTION | r_nbd_refined0.178 | 0.2 | 721 | X-RAY DIFFRACTION | r_nbd_other0.264 | 0.2 | 4787 | X-RAY DIFFRACTION | r_nbtor_other0.089 | 0.2 | 2840 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.168 | 0.2 | 352 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.271 | 0.2 | 27 | X-RAY DIFFRACTION | r_symmetry_vdw_other0.324 | 0.2 | 118 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.186 | 0.2 | 54 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_mcbond_it0.863 | 1.5 | 2943 | X-RAY DIFFRACTION | r_mcangle_it1.549 | 2 | 4720 | X-RAY DIFFRACTION | r_scbond_it2.071 | 3 | 1684 | X-RAY DIFFRACTION | r_scangle_it3.117 | 4.5 | 1540 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.37→1.405 Å / Total num. of bins used: 20 / | Rfactor | 反射数 |
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Rfree | 0.228 | 129 |
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Rwork | 0.209 | 6486 |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 0.2909 | 0.0963 | -0.067 | 0.7175 | -0.0163 | 1.026 | -0.0099 | -0.0252 | 0.0187 | 0.0726 | 0.0209 | -0.017 | 0.0897 | 0.0019 | -0.0109 | 0.0133 | -0.0003 | -0.006 | 0.063 | -0.0007 | 0.0609 | 17.101 | -2.514 | 55.247 | 2 | 0.2975 | -0.2439 | -0.0074 | 0.6904 | 0.1022 | 0.7911 | 0.0344 | 0.0133 | 0.0121 | -0.1028 | -0.0188 | -0.0109 | -0.089 | -0.0168 | -0.0155 | 0.0318 | -0.0069 | 0.0054 | 0.0494 | 0.0021 | 0.061 | 17.345 | 13.054 | 36.574 | 3 | 0.4122 | -0.0319 | -0.1878 | 0.725 | -0.271 | 1.0271 | -0.0084 | -0.0343 | -0.0339 | 0.0158 | -0.0131 | -0.0073 | 0.0442 | 0.0388 | 0.0215 | 0.001 | -0.0063 | -0.0053 | 0.0637 | 0.002 | 0.0687 | 26.857 | 33.688 | 16.988 | 4 | 0.3795 | -0.106 | 0.141 | 0.728 | -0.2665 | 0.8003 | 0.0006 | 0.029 | 0.0562 | -0.1032 | -0.042 | 0.0115 | -0.0742 | 0.008 | 0.0414 | 0.0474 | 0.004 | -0.0121 | 0.0381 | 0.0064 | 0.0528 | 27.133 | 51.011 | 0.175 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA2 - 152 | 1 - 151 | 2 | X-RAY DIFFRACTION | 2 | BB2 - 153 | 1 - 152 | 3 | X-RAY DIFFRACTION | 3 | CC2 - 153 | 1 - 152 | 4 | X-RAY DIFFRACTION | 4 | DD2 - 153 | 1 - 152 | | | | | | | | |
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精密化 | *PLUS 最低解像度: 25 Å / Num. reflection obs: 92538 / Rfactor Rfree: 0.182 / Rfactor Rwork: 0.154 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | r_bond_d0.011 | X-RAY DIFFRACTION | r_angle_d | X-RAY DIFFRACTION | r_angle_deg1.4 | | | |
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