HETEROGEN CONTINUOUS, NON-PROTEIN SURFACE DENSITY WAS MODELED AS RESIDUE UNL, OXYGENS IN AN UNKNOWN ...HETEROGEN CONTINUOUS, NON-PROTEIN SURFACE DENSITY WAS MODELED AS RESIDUE UNL, OXYGENS IN AN UNKNOWN LIGAND, 701-702.
解像度: 2.1→35.19 Å / Cor.coef. Fo:Fc: 0.963 / Cor.coef. Fo:Fc free: 0.931 / SU B: 13.953 / SU ML: 0.179 / TLS residual ADP flag: LIKELY RESIDUAL / Isotropic thermal model: ISOTROPIC / 交差検証法: THROUGHOUT / ESU R: 0.189 / ESU R Free: 0.185 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. SULFATE AND CHLORIDE WERE IN THE CRYSTALLIZATION AND PROTEIN BUFFERS RESPECTIVELY 3. A SEPARATE TLS GROUP WAS DEFINED FOR SULFATE 504 ...詳細: 1. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. 2. SULFATE AND CHLORIDE WERE IN THE CRYSTALLIZATION AND PROTEIN BUFFERS RESPECTIVELY 3. A SEPARATE TLS GROUP WAS DEFINED FOR SULFATE 504 SINCE IT APPEARED DIRECTIONALLY DISORDERED. 4. CONTINUOUS, NON-PROTEIN SURFACE DENSITY WAS MODELED AS RESIDUE UNL, OXYGENS IN AN UNKNOWN LIGAND, 701-702. THESE ATOMS WERE ASSIGNED A V/D WAALS RADIUS OF ZERO DURING REFINEMENT.
Rfactor
反射数
%反射
Selection details
Rfree
0.24421
1676
5.1 %
RANDOM
Rwork
0.18107
-
-
-
obs
0.1842
31388
92.1 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 42.889 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.56 Å2
-0.78 Å2
0 Å2
2-
-
-1.56 Å2
0 Å2
3-
-
-
2.34 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→35.19 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3362
0
31
323
3716
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.022
3437
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
3204
X-RAY DIFFRACTION
r_angle_refined_deg
1.69
1.972
4637
X-RAY DIFFRACTION
r_angle_other_deg
0.878
3
7447
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.666
5
418
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.637
23.896
154
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.419
15
641
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
14.719
15
24
X-RAY DIFFRACTION
r_chiral_restr
0.094
0.2
525
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
3735
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
683
X-RAY DIFFRACTION
r_nbd_refined
0.227
0.2
831
X-RAY DIFFRACTION
r_nbd_other
0.19
0.2
3634
X-RAY DIFFRACTION
r_nbtor_other
0.093
0.2
2261
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.214
0.2
248
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.287
0.2
16
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.312
0.2
46
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.29
0.2
20
X-RAY DIFFRACTION
r_mcbond_it
0.945
1.5
2243
X-RAY DIFFRACTION
r_mcangle_it
1.349
2
3384
X-RAY DIFFRACTION
r_scbond_it
2.215
3
1472
X-RAY DIFFRACTION
r_scangle_it
3.403
4.5
1253
LS精密化 シェル
解像度: 2.1→2.155 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.412
80
5.11 %
Rwork
0.286
1487
-
精密化 TLS
手法: refined / Refine-ID: X-RAY DIFFRACTION
ID
L11 (°2)
L12 (°2)
L13 (°2)
L22 (°2)
L23 (°2)
L33 (°2)
S11 (Å °)
S12 (Å °)
S13 (Å °)
S21 (Å °)
S22 (Å °)
S23 (Å °)
S31 (Å °)
S32 (Å °)
S33 (Å °)
T11 (Å2)
T12 (Å2)
T13 (Å2)
T22 (Å2)
T23 (Å2)
T33 (Å2)
Origin x (Å)
Origin y (Å)
Origin z (Å)
1
2.0727
0.0294
0.3223
1.664
-0.7572
3.7148
0.1552
-0.1327
0.0698
0.1467
-0.0379
0.1315
-0.2305
0.0812
-0.1173
-0.1893
-0.0361
0.009
-0.2511
-0.0315
-0.1611
30.9696
3.8689
106.0164
2
5.5394
0.4195
0.5225
4.5437
3.1677
4.0782
0.1496
-0.2496
0.4727
-0.0247
0.0661
-0.3336
-0.2954
0.0307
-0.2156
-0.1497
-0.031
0.0315
-0.1459
-0.0945
-0.1224
58.1688
-0.9186
108.5032
3
514.6232
-158.2912
-200.8499
565.7059
97.8641
533.3522
0.4665
-0.3681
-0.9422
1.6884
-0.5417
-0.6157
-0.4614
1.4909
0.0752
0.1475
0.0512
0.0598
0.1476
-0.0011
0.1575
66.4947
3.7049
93.8952
精密化 TLSグループ
Refine-ID: X-RAY DIFFRACTION / Selection: ALL / Auth asym-ID: A