ソフトウェア | 名称 | バージョン | 分類 |
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HKL-2000 | | データ収集 | TRUNCATE | | データ削減 | SHARP | | 位相決定 | REFMAC | 5.1.24精密化 | HKL-2000 | | データ削減 | CCP4 | (TRUNCATE)データスケーリング | | |
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精密化 | 構造決定の手法: 多波長異常分散 / 解像度: 1.94→30 Å / Cor.coef. Fo:Fc: 0.959 / Cor.coef. Fo:Fc free: 0.93 / SU B: 3.308 / SU ML: 0.094 / TLS residual ADP flag: LIKELY RESIDUAL / Isotropic thermal model: TLS / 交差検証法: THROUGHOUT / ESU R: 0.178 / ESU R Free: 0.157 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.2268 | 1182 | 5.1 % | RANDOM |
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Rwork | 0.18424 | - | - | - |
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obs | 0.18641 | 21926 | 99.7 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 21.106 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -1.58 Å2 | 0 Å2 | 0.62 Å2 |
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2- | - | 0.05 Å2 | 0 Å2 |
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3- | - | - | 2.16 Å2 |
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Refine analyze | Luzzati coordinate error obs: 0.246 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.94→30 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2454 | 0 | 0 | 254 | 2708 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.015 | 0.021 | 2454 | X-RAY DIFFRACTION | r_bond_other_d0.001 | 0.02 | 2280 | X-RAY DIFFRACTION | r_angle_refined_deg1.803 | 1.945 | 3315 | X-RAY DIFFRACTION | r_angle_other_deg0.874 | 3 | 5303 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg7.542 | 5 | 323 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg | | | X-RAY DIFFRACTION | r_chiral_restr0.127 | 0.2 | 397 | X-RAY DIFFRACTION | r_gen_planes_refined0.008 | 0.02 | 2745 | X-RAY DIFFRACTION | r_gen_planes_other0.004 | 0.02 | 454 | X-RAY DIFFRACTION | r_nbd_refined0.247 | 0.3 | 452 | X-RAY DIFFRACTION | r_nbd_other0.267 | 0.3 | 2743 | X-RAY DIFFRACTION | r_nbtor_other0.094 | 0.5 | 1630 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.212 | 0.5 | 310 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.134 | 0.3 | 18 | X-RAY DIFFRACTION | r_symmetry_vdw_other0.328 | 0.3 | 53 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.3 | 0.5 | 26 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_mcbond_it1.902 | 1.5 | 1599 | X-RAY DIFFRACTION | r_mcangle_it3.06 | 2 | 2575 | X-RAY DIFFRACTION | r_scbond_it5.018 | 3 | 855 | X-RAY DIFFRACTION | r_scangle_it7.528 | 4.5 | 740 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.94→1.99 Å / Total num. of bins used: 20 / | Rfactor | 反射数 |
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Rfree | 0.252 | 79 |
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Rwork | 0.24 | 1560 |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 2.4901 | 1.6665 | 0.5331 | 4.7488 | 0.2066 | 1.4838 | -0.1519 | 0.2056 | -0.1612 | -0.2671 | 0.2494 | -0.2525 | 0.1707 | -0.0105 | -0.0974 | 0.1062 | -0.0302 | 0.0481 | 0.1189 | 0.0075 | 0.0259 | 28.941 | -13.697 | 9.727 | 2 | 3.6759 | -0.7084 | -0.6635 | 3.8885 | 1.5039 | 2.1664 | -0.0284 | 0.2724 | -0.0987 | -0.1093 | 0.1331 | 0.2292 | -0.0011 | 0.0513 | -0.1047 | 0.0389 | -0.0169 | -0.0015 | 0.0859 | 0.0204 | 0.0613 | 5.774 | 0.3 | 12.972 | 3 | 2.1459 | 0.309 | 0.0446 | 2.0718 | 0.9157 | 2.1608 | -0.1679 | -0.0405 | 0.0489 | 0.0659 | 0.1251 | -0.1026 | -0.1562 | 0.0591 | 0.0429 | 0.0837 | -0.0097 | 0.0148 | 0.0845 | 0.0391 | 0.0861 | 14.838 | 20.346 | 25.414 | 4 | 2.7931 | 0.6351 | 0.0926 | 2.7338 | 0.2181 | 1.3753 | 0.0748 | -0.0263 | 0.3832 | 0.1843 | -0.0488 | -0.1048 | 0.1073 | 0.0388 | -0.0261 | 0.0346 | -0.0162 | 0.0343 | 0.0374 | -0.0186 | 0.1476 | 38.612 | 7.457 | 19.571 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA112 - 194 | 5 - 87 | 2 | X-RAY DIFFRACTION | 2 | AA197 - 271 | 90 - 164 | 3 | X-RAY DIFFRACTION | 3 | BB112 - 194 | 5 - 87 | 4 | X-RAY DIFFRACTION | 4 | BB197 - 270 | 90 - 163 | | | | | | | | |
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精密化 | *PLUS 最低解像度: 30 Å / Rfactor Rfree: 0.227 / Rfactor Rwork: 0.184 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | r_bond_d0.015 | X-RAY DIFFRACTION | r_angle_d | X-RAY DIFFRACTION | r_angle_deg1.8 | | | |
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LS精密化 シェル | *PLUS Rfactor Rwork: 0.24 |
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