解像度: 1.4→1.47 Å / 冗長度: 11.7 % / Rmerge(I) obs: 0.312 / Mean I/σ(I) obs: 2.7 / % possible all: 97.4
反射
*PLUS
最低解像度: 45 Å / % possible obs: 99.6 % / Rmerge(I) obs: 0.05
反射 シェル
*PLUS
% possible obs: 97.4 %
-
解析
ソフトウェア
名称
バージョン
分類
ProDC
データ収集
SCALA
データスケーリング
SHELXD
位相決定
SHARP
位相決定
REFMAC
5.1.24
精密化
CCP4
(SCALA)
データスケーリング
精密化
構造決定の手法: RIP - Radiation-Damage Induced Phasing 解像度: 1.4→42 Å / Cor.coef. Fo:Fc: 0.972 / Cor.coef. Fo:Fc free: 0.96 / SU B: 0.695 / SU ML: 0.029 Isotropic thermal model: Anisotropic for protein and ligands. Water molecules are refined isotropic 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.058 / ESU R Free: 0.054 詳細: Model 1n6x was refined against data collected before the "X-ray burn" and used for some additional cycles of refinement against the data after the "X-ray burn". The resulting difference Fo-Fc ...詳細: Model 1n6x was refined against data collected before the "X-ray burn" and used for some additional cycles of refinement against the data after the "X-ray burn". The resulting difference Fo-Fc map shows features characteristic for radiation damage, such as negative density for the disulphides. This model has not been manually adjusted to these features! Structure was phased using X-ray damage alone
Rfactor
反射数
%反射
Selection details
Rfree
0.17021
2061
5 %
RANDOM
Rwork
0.14051
-
-
-
all
0.142
40971
-
-
obs
0.142
40971
99.83 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 14.552 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.1 Å2
0 Å2
0 Å2
2-
-
0.02 Å2
0 Å2
3-
-
-
0.08 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.4→42 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1629
0
25
288
1942
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.017
0.021
1698
X-RAY DIFFRACTION
r_angle_refined_deg
1.633
1.959
2304
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.285
5
222
X-RAY DIFFRACTION
r_chiral_restr
0.125
0.2
257
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.02
1248
X-RAY DIFFRACTION
r_nbd_refined
0.199
0.2
740
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.125
0.2
185
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.179
0.2
40
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.156
0.2
26
X-RAY DIFFRACTION
r_mcbond_it
1.758
1.5
1102
X-RAY DIFFRACTION
r_mcangle_it
2.799
2
1771
X-RAY DIFFRACTION
r_scbond_it
3.656
3
596
X-RAY DIFFRACTION
r_scangle_it
4.876
4.5
533
X-RAY DIFFRACTION
r_rigid_bond_restr
1.419
2
1653
X-RAY DIFFRACTION
r_sphericity_free
1.774
40
1
X-RAY DIFFRACTION
r_sphericity_bonded
7.18
40
1620
LS精密化 シェル
解像度: 1.4→1.436 Å / Total num. of bins used: 20 /
Rfactor
反射数
Rfree
0.239
150
Rwork
0.194
2804
精密化
*PLUS
最高解像度: 1.4 Å / 最低解像度: 45 Å / Num. reflection obs: 40972 / Rfactor Rfree: 0.173 / Rfactor Rwork: 0.143