解像度: 3→12 Å / Rfactor Rfree error: 0.03 / 交差検証法: THROUGHOUT / σ(F): 1 詳細: THE EXTENDED LOOP REGION OF THE B SUBUNIT (186-200) WAS MODELED AFTER THE APO STRUCTURE EXTENDED LOOP
Rfactor
反射数
%反射
Selection details
Rfree
0.315
494
5 %
RANDOM
Rwork
0.182
-
-
-
obs
0.182
9322
93.1 %
-
精密化ステップ
サイクル: LAST / 解像度: 3→12 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4358
0
116
18
4492
拘束条件
Refine-ID
タイプ
Dev ideal
X-RAY DIFFRACTION
x_bond_d
0.011
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
1.65
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
24.06
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
1.61
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
X-RAY DIFFRACTION
x_mcangle_it
X-RAY DIFFRACTION
x_scbond_it
X-RAY DIFFRACTION
x_scangle_it
Refine LS restraints NCS
Ens-ID
Dom-ID
NCS model details
Refine-ID
Rms dev position (Å)
Weight position
1
1
RESTRAINTS
X-RAY DIFFRACTION
3.5
100
2
2
X-RAY DIFFRACTION
3.5
10
3
3
X-RAY DIFFRACTION
3.5
5
LS精密化 シェル
解像度: 3→3.23 Å / Rfactor Rfree: 0.373 / Rfactor Rwork: 0.223 / Total num. of bins used: 8