ソフトウェア | 名称 | バージョン | 分類 |
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X-PLOR | | モデル構築 | X-PLOR | 3.851 | 精密化 | DENZO | | データ削減 | SCALEPACK | | データスケーリング | X-PLOR | | 位相決定 |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 1AQU 解像度: 2.4→100 Å / Rfactor Rfree error: 0.008 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0 / 詳細: BULK SOLVENT MODEL USED
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.288 | 1436 | 10.1 % | RANDOM |
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Rwork | 0.276 | - | - | - |
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obs | - | 14265 | 97.9 % | - |
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原子変位パラメータ | Biso mean: 29 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0 Å2 | 0 Å2 |
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3- | - | - | 0 Å2 |
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Refine analyze | | Free | Obs |
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Luzzati coordinate error | 0.4 Å | 0.36 Å |
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Luzzati d res low | - | 5 Å |
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Luzzati sigma a | 0.42 Å | 0.4 Å |
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精密化ステップ | サイクル: LAST / 解像度: 2.4→100 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 1766 | 0 | 5 | 52 | 1823 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_bond_d0.005 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg1.1 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d23.3 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d1.13 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it1.4 | 1.5 | X-RAY DIFFRACTION | x_mcangle_it2.44 | 2 | X-RAY DIFFRACTION | x_scbond_it1.85 | 2 | X-RAY DIFFRACTION | x_scangle_it2.93 | 2.5 | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.4→2.55 Å / Rfactor Rfree error: 0.021 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
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Rfree | 0.336 | 254 | 11 % |
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Rwork | 0.345 | 2056 | - |
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obs | - | - | 96.5 % |
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Xplor file | Refine-ID | Serial no | Param file | Topol file |
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X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PROX-RAY DIFFRACTION | 2 | PARAM19.SOLTIP3P.TOPOLOGYX-RAY DIFFRACTION | 3 | PARHCSDX.PRSO4.TOP | | | | | |
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ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.851 / 分類: refinement |
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精密化 | *PLUS σ(F): 0 / % reflection Rfree: 10.1 % / Rfactor obs: 0.276 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS Biso mean: 29 Å2 |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal | Dev ideal target |
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X-RAY DIFFRACTION | x_angle_deg1.1 | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg23.3 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg1.13 | | X-RAY DIFFRACTION | x_mcbond_it | 1.5 | X-RAY DIFFRACTION | x_scbond_it | 2 | X-RAY DIFFRACTION | x_mcangle_it | 2 | X-RAY DIFFRACTION | x_scangle_it | 2.5 | | | | | | | | | |
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LS精密化 シェル | *PLUS Rfactor Rfree: 0.336 / % reflection Rfree: 11 % / Rfactor Rwork: 0.345 |
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