| ソフトウェア | | 名称 | バージョン | 分類 |
|---|
CCP4 | | モデル構築 | X-PLOR | 3.851 | 精密化 | | DENZO | | データ削減 | | SCALEPACK | | データスケーリング | CCP4 | | 位相決定 |
|
|---|
| 精密化 | 解像度: 2→8 Å / 交差検証法: THROUGHOUT / σ(F): 0
| Rfactor | 反射数 | %反射 | Selection details |
|---|
| Rfree | 0.272 | 1221 | 10 % | RANDOM |
|---|
| Rwork | 0.203 | - | - | - |
|---|
| obs | 0.203 | 12271 | 90 % | - |
|---|
|
|---|
| 精密化ステップ | サイクル: LAST / 解像度: 2→8 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
|---|
| 原子数 | 1181 | 0 | 3 | 156 | 1340 |
|---|
|
|---|
| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
|---|
| X-RAY DIFFRACTION | x_bond_d| 0.015 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 1.61 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d| 25.81 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d| 0.776 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
|
|---|
| LS精密化 シェル | 解像度: 2→2.15 Å / Total num. of bins used: 8
| Rfactor | 反射数 | %反射 |
|---|
| Rfree | 0.297 | 136 | 9.8 % |
|---|
| Rwork | 0.272 | 1526 | - |
|---|
| obs | - | - | 99 % |
|---|
|
|---|
| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
|---|
| X-RAY DIFFRACTION | 1 | PROTEIN_REP.PARAMTOPHCSDX.PRO| X-RAY DIFFRACTION | 2 | PARAM11.WATTOPH19.PEP| X-RAY DIFFRACTION | 3 | PARAMED.LIGTOPH11.WAT| X-RAY DIFFRACTION | 4 | | TOPO.TUNG | | | | | | |
|
|---|
| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.851 / 分類: refinement |
|---|
| 精密化 | *PLUS 最高解像度: 2 Å / 最低解像度: 8 Å / σ(F): 0 / % reflection Rfree: 10 % |
|---|
| 溶媒の処理 | *PLUS |
|---|
| 原子変位パラメータ | *PLUS |
|---|
| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
|---|
| X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 25.81 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 0.776 | | | | |
|
|---|
| LS精密化 シェル | *PLUS 最高解像度: 2 Å / Rfactor Rfree: 0.297 / % reflection Rfree: 9.8 % / Rfactor Rwork: 0.272 / Rfactor obs: 0.272 |
|---|