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Showing all 7 items for (author: zottig & x)

EMDB-43419:
Tomogram 1 - thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N

EMDB-43420:
Tomogram 2 - Thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N

EMDB-43424:
Tomogram 3 - Thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N

EMDB-43425:
Tomogram 4 - Thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N

EMDB-43427:
Tomogram 5 - Thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N

EMDB-43428:
Tomogram 6 - Thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N

EMDB-43429:
Tomogram 7 - Thickness measurement
Method: electron tomography / : Elferich J, Kong L, Zottig X, Grigorieff N