構造決定の手法: 分子置換 / 解像度: 2.05→38.922 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.924 / SU B: 12.511 / SU ML: 0.161 / 交差検証法: THROUGHOUT / ESU R: 0.208 / ESU R Free: 0.19 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2651
874
4.863 %
Rwork
0.2107
17098
-
all
0.213
-
-
obs
-
17972
99.917 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 47.018 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.755 Å2
-0.378 Å2
-0 Å2
2-
-
-0.755 Å2
0 Å2
3-
-
-
2.451 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.05→38.922 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1890
0
70
61
2021
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.011
0.012
2006
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
1862
X-RAY DIFFRACTION
r_angle_refined_deg
2.198
1.827
2717
X-RAY DIFFRACTION
r_angle_other_deg
0.717
1.744
4338
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.791
5
254
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
30.607
13.571
14
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.243
10
310
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
14.984
10
71
X-RAY DIFFRACTION
r_chiral_restr
0.1
0.2
300
X-RAY DIFFRACTION
r_gen_planes_refined
0.01
0.02
2274
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
398
X-RAY DIFFRACTION
r_nbd_refined
0.216
0.2
394
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.199
0.2
1701
X-RAY DIFFRACTION
r_nbtor_refined
0.182
0.2
1022
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.095
0.2
1036
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.157
0.2
76
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_other
0.015
0.2
1
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.469
0.2
10
X-RAY DIFFRACTION
r_nbd_other
0.15
0.2
37
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.076
0.2
5
X-RAY DIFFRACTION
r_mcbond_it
3.368
2.867
1022
X-RAY DIFFRACTION
r_mcbond_other
3.358
2.866
1022
X-RAY DIFFRACTION
r_mcangle_it
4.356
5.143
1274
X-RAY DIFFRACTION
r_mcangle_other
4.355
5.143
1275
X-RAY DIFFRACTION
r_scbond_it
3.662
3.013
984
X-RAY DIFFRACTION
r_scbond_other
3.66
3.012
985
X-RAY DIFFRACTION
r_scangle_it
5.114
5.437
1443
X-RAY DIFFRACTION
r_scangle_other
5.112
5.436
1444
X-RAY DIFFRACTION
r_lrange_it
6.797
28.533
2217
X-RAY DIFFRACTION
r_lrange_other
6.801
28.51
2214
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.118
0.05
3572
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
B
X-RAY DIFFRACTION
Localncs
0.11842
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.11842
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20