プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.000011 Å / 相対比: 1
反射
解像度: 2.147→34.357 Å / Num. obs: 27574 / % possible obs: 97.8 % / 冗長度: 10.45 % 詳細: Some remarks regarding the mmCIF items written, the PDB Exchange Dictionary (PDBx/mmCIF) Version 5.0 supporting the data files in the current PDB archive (dictionary version 5.325, last ...詳細: Some remarks regarding the mmCIF items written, the PDB Exchange Dictionary (PDBx/mmCIF) Version 5.0 supporting the data files in the current PDB archive (dictionary version 5.325, last updated 2020-04-13: http://mmcif.wwpdb.org/dictionaries/mmcif_pdbx_v50.dic/Index/) and the actual quantities provided by MRFANA (https://github.com/githubgphl/MRFANA) from the autoPROC package (https://www.globalphasing.com/autoproc/). In general, the mmCIF categories here should provide items that are currently used in the PDB archive. If there are alternatives, the one recommended by the PDB developers has been selected. The distinction between *_all and *_obs quantities is not always clear: often only one version is actively used within the PDB archive (or is the one recommended by PDB developers). The intention of distinguishing between classes of reflections before and after some kind of observation criterion was applied, can in principle be useful - but such criteria change in various ways throughout the data processing steps (rejection of overloaded or too partial reflections, outlier/misfit rejections during scaling etc) and there is no retrospect computation of data scaling/merging statistics for the reflections used in the final refinement (where another observation criterion might have been applied). Typical data processing will usually only provide one version of statistics at various stages and these are given in the recommended item here, irrespective of the "_all" and "_obs" connotation, see e.g. the use of _reflns.pdbx_Rmerge_I_obs, _reflns.pdbx_Rrim_I_all and _reflns.pdbx_Rpim_I_all. Please note that all statistics related to "merged intensities" (or "merging") are based on inverse-variance weighting of the individual measurements making up a symmetry-unique reflection. This is standard for several decades now, even if some of the dictionary definitions seem to suggest that a simple "mean" or "average" intensity is being used instead. R-values are always given for all symmetry-equivalent reflections following Friedel's law, i.e. Bijvoet pairs are not treated separately (since we want to describe the overall mean intensity and not the mean I(+) and I(-) here). The Rrim metric is identical to the Rmeas R-value and only differs in name. _reflns.pdbx_number_measured_all is the number of measured intensities just before the final merging step (at which point no additional rejection takes place). _reflns.number_obs is the number of symmetry-unique observations, i.e. the result of merging those measurements via inverse-variance weighting. _reflns.pdbx_netI_over_sigmaI is based on the merged intensities (_reflns.number_obs) as expected. _reflns.pdbx_redundancy is synonymous with "multiplicity". The per-shell item _reflns_shell.number_measured_all corresponds to the overall value _reflns.pdbx_number_measured_all. The per-shell item _reflns_shell.number_unique_all corresponds to the overall value _reflns.number_obs. The per-shell item _reflns_shell.percent_possible_all corresponds to the overall value _reflns.percent_possible_obs. The per-shell item _reflns_shell.meanI_over_sigI_obs corresponds to the overall value given as _reflns.pdbx_netI_over_sigmaI. But be aware of the incorrect definition of the former in the current dictionary! CC1/2: 0.999 / CC1/2 anomalous: 0.006 / Rmerge(I) obs: 0.0721 / Rpim(I) all: 0.0234 / Rrim(I) all: 0.0759 / AbsDiff over sigma anomalous: 0.751 / Net I/σ(I): 18.25 / Num. measured all: 288086 / % possible anomalous: 97.6 / Redundancy anomalous: 5.4
反射 シェル
解像度 (Å)
冗長度 (%)
Rmerge(I) obs
Mean I/σ(I) obs
Num. measured all
Num. measured obs
Num. unique all
Num. unique obs
CC1/2
CC1/2 anomalous
Rpim(I) all
Rrim(I) all
AbsDiff over sigma anomalous
% possible anomalous
Redundancy anomalous
% possible all
4.622-34.357
10.05
0.0345
49.23
29526
29526
2938
2938
0.999
-0.005
0.0114
0.0363
0.783
100
5.31
100
3.67-4.622
10.47
0.0414
43.76
28208
28208
2694
2694
0.999
0.042
0.0134
0.0436
0.761
94.1
5.45
94.7
3.206-3.67
10.67
0.0631
31.35
24861
24861
2329
2329
0.998
-0.105
0.0203
0.0663
0.775
81.6
5.55
82.1
2.913-3.206
10.93
0.1017
20.95
30571
30571
2798
2798
0.997
0.033
0.0321
0.1067
0.784
100
5.63
100
2.705-2.913
9.93
0.1655
12.95
28034
28034
2823
2823
0.993
-0.023
0.0551
0.1746
0.769
100
5.11
100
2.545-2.705
9.95
0.2448
9.21
27800
27800
2794
2794
0.984
-0.037
0.0813
0.2582
0.763
99.9
5.12
100
2.418-2.545
10.44
0.3855
6.25
29323
29323
2810
2810
0.963
-0.044
0.1247
0.4055
0.711
100
5.37
100
2.313-2.418
10.62
0.5363
4.57
29540
29540
2782
2782
0.941
-0.008
0.1719
0.5635
0.724
100
5.45
100
2.224-2.313
10.69
0.7808
3.35
30087
30087
2815
2815
0.883
0.02
0.2497
0.8202
0.747
100
5.48
100
2.147-2.224
10.8
1.0368
2.49
30136
30136
2791
2791
0.818
-0.014
0.3296
1.0884
0.697
100
5.52
100
-
解析
ソフトウェア
名称
バージョン
分類
autoPROC
1.1.720230222
dataprocessing
XDS
Jan10, 2022
データ削減
Aimless
0.7.9
データスケーリング
TRUNCATE
8.0.011
dataprocessing
PHASER
位相決定
BUSTER
2.11.8
精密化
精密化
構造決定の手法: 分子置換 / 解像度: 2.147→34.36 Å / Cor.coef. Fo:Fc: 0.952 / Cor.coef. Fo:Fc free: 0.948 / SU R Cruickshank DPI: 0.289 / 交差検証法: THROUGHOUT / SU R Blow DPI: 0.182 / SU Rfree Blow DPI: 0.148 / SU Rfree Cruickshank DPI: 0.146
Rfactor
反射数
%反射
Selection details
Rfree
0.2128
1152
-
RANDOM
Rwork
0.1968
-
-
-
obs
0.1975
27574
97.7 %
-
原子変位パラメータ
Biso mean: 56.71 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0 Å2
0 Å2
0 Å2
2-
-
0 Å2
0 Å2
3-
-
-
0 Å2
Refine analyze
Luzzati coordinate error obs: 0.25 Å
精密化ステップ
サイクル: LAST / 解像度: 2.147→34.36 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2520
0
44
212
2776
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
5234
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.04
9505
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
1563
SINUSOIDAL
2
X-RAY DIFFRACTION
t_gen_planes
792
HARMONIC
5
X-RAY DIFFRACTION
t_it
2648
HARMONIC
10
X-RAY DIFFRACTION
t_nbd
0
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_chiral_improper_torsion
339
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_ideal_dist_contact
4717
SEMIHARMONIC
4
X-RAY DIFFRACTION
t_omega_torsion
3.56
X-RAY DIFFRACTION
t_other_torsion
15.58
LS精密化 シェル
解像度: 2.15→2.16 Å
Rfactor
反射数
%反射
Rfree
0.2403
23
-
Rwork
0.2402
-
-
obs
0.2402
552
100 %
精密化 TLS
Origin x: 24.5719 Å / Origin y: 8.0303 Å / Origin z: 58.9529 Å