構造決定の手法: 分子置換 / 解像度: 2.14→44.76 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.929 / SU B: 14.649 / SU ML: 0.171 / 交差検証法: THROUGHOUT / ESU R: 0.295 / ESU R Free: 0.214 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: U VALUES : WITH TLS ADDED HYDROGENS HAVE BEEN USED IF PRESENT IN THE INPUT U VALUES : RESIDUAL ONLY
Rfactor
反射数
%反射
Selection details
Rfree
0.24722
947
5 %
RANDOM
Rwork
0.20751
-
-
-
obs
0.2094
17948
99.67 %
-
溶媒の処理
イオンプローブ半径: 0.7 Å / 減衰半径: 0.7 Å / VDWプローブ半径: 1.1 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 41.061 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-2.95 Å2
0 Å2
-0 Å2
2-
-
-1.8 Å2
-0 Å2
3-
-
-
4.75 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.14→44.76 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2759
0
34
29
2822
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.006
0.016
2868
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
2627
X-RAY DIFFRACTION
r_angle_refined_deg
1.01
1.79
3891
X-RAY DIFFRACTION
r_angle_other_deg
0.393
1.556
6050
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.971
5.28
375
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
6.914
16.25
8
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.789
10
455
X-RAY DIFFRACTION
r_chiral_restr
0.046
0.2
420
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
3405
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
675
X-RAY DIFFRACTION
r_mcbond_it
0.27
1.738
1416
X-RAY DIFFRACTION
r_mcbond_other
0.27
1.738
1416
X-RAY DIFFRACTION
r_mcangle_it
0.49
3.126
1767
X-RAY DIFFRACTION
r_mcangle_other
0.49
3.126
1768
X-RAY DIFFRACTION
r_scbond_it
0.243
1.796
1452
X-RAY DIFFRACTION
r_scbond_other
0.243
1.796
1453
X-RAY DIFFRACTION
r_scangle_other
0.437
3.285
2124
X-RAY DIFFRACTION
r_long_range_B_refined
2.394
16.78
3156
X-RAY DIFFRACTION
r_long_range_B_other
2.392
16.77
3155
LS精密化 シェル
解像度: 2.14→2.193 Å
Rfactor
反射数
%反射
Rfree
0.396
62
-
Rwork
0.394
1256
-
obs
-
-
97.49 %
精密化 TLS
手法: refined / Origin x: -5.236 Å / Origin y: -13.38 Å / Origin z: 19.933 Å