ソフトウェア 名称 バージョン 分類 REFMAC5.8.0405精密化 CrystFELデータ削減 CrystFELデータスケーリング PHASER位相決定
精密化 構造決定の手法 : 分子置換 / 解像度 : 1.69→37.904 Å / Cor.coef. Fo :Fc : 0.968 / Cor.coef. Fo :Fc free : 0.966 / SU B : 1.657 / SU ML : 0.053 / 交差検証法 : FREE R-VALUE / ESU R : 0.078 / ESU R Free : 0.072 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.1688 1412 4.829 % Rwork 0.1576 27825 - all 0.158 - - obs - 29237 98.934 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 28.84 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.389 Å2 0 Å2 -0 Å2 2- - 0.389 Å2 -0 Å2 3- - - -0.777 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.69→37.904 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 1546 0 10 128 1684
拘束条件 大きな表を表示 (5 x 30) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.013 0.011 1629 X-RAY DIFFRACTION r_bond_other_d0.001 0.016 1460 X-RAY DIFFRACTION r_angle_refined_deg1.751 1.656 2222 X-RAY DIFFRACTION r_angle_other_deg0.64 1.568 3388 X-RAY DIFFRACTION r_dihedral_angle_1_deg6.946 5 217 X-RAY DIFFRACTION r_dihedral_angle_2_deg8.124 5 12 X-RAY DIFFRACTION r_dihedral_angle_3_deg13.898 10 251 X-RAY DIFFRACTION r_dihedral_angle_6_deg16.535 10 67 X-RAY DIFFRACTION r_chiral_restr0.089 0.2 238 X-RAY DIFFRACTION r_gen_planes_refined0.01 0.02 1960 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 392 X-RAY DIFFRACTION r_nbd_refined0.21 0.2 300 X-RAY DIFFRACTION r_symmetry_nbd_other0.2 0.2 1442 X-RAY DIFFRACTION r_nbtor_refined0.194 0.2 878 X-RAY DIFFRACTION r_symmetry_nbtor_other0.095 0.2 982 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.238 0.2 98 X-RAY DIFFRACTION r_symmetry_nbd_refined0.214 0.2 15 X-RAY DIFFRACTION r_nbd_other0.21 0.2 59 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.197 0.2 20 X-RAY DIFFRACTION r_xyhbond_nbd_other0.028 0.2 2 X-RAY DIFFRACTION r_mcbond_it2.499 2.681 835 X-RAY DIFFRACTION r_mcbond_other2.488 2.68 835 X-RAY DIFFRACTION r_mcangle_it3.385 4.786 1045 X-RAY DIFFRACTION r_mcangle_other3.388 4.788 1046 X-RAY DIFFRACTION r_scbond_it4.922 3.242 794 X-RAY DIFFRACTION r_scbond_other4.924 3.241 793 X-RAY DIFFRACTION r_scangle_it7.438 5.632 1171 X-RAY DIFFRACTION r_scangle_other7.439 5.631 1171 X-RAY DIFFRACTION r_lrange_it8.558 28.658 1877 X-RAY DIFFRACTION r_lrange_other8.523 28.307 1862
LS精密化 シェル Refine-ID : X-RAY DIFFRACTION / Total num. of bins used : 20
大きな表を表示 (11 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Rfactor all Num. reflection all Fsc free Fsc work % reflection obs (%)WRfactor Rwork 1.69-1.733 0.237 68 0.28 1928 0.278 2139 0.953 0.944 93.3146 0.259 1.733-1.781 0.246 116 0.231 1960 0.232 2076 0.954 0.964 100 0.204 1.781-1.832 0.213 97 0.2 1929 0.2 2026 0.971 0.974 100 0.168 1.832-1.889 0.197 106 0.177 1848 0.178 1954 0.975 0.98 100 0.144 1.889-1.95 0.181 90 0.151 1839 0.153 1929 0.98 0.986 100 0.124 1.95-2.019 0.133 82 0.136 1766 0.135 1848 0.99 0.989 100 0.114 2.019-2.095 0.145 83 0.136 1716 0.137 1799 0.987 0.988 100 0.113 2.095-2.18 0.171 83 0.167 1470 0.167 1721 0.958 0.97 90.2382 0.142 2.18-2.276 0.42 73 0.419 1601 0.419 1674 0.745 0.778 100 0.169 2.276-2.387 0.164 82 0.154 1497 0.154 1579 0.982 0.983 100 0.135 2.387-2.516 0.16 68 0.14 1481 0.141 1549 0.985 0.989 100 0.127 2.516-2.668 0.155 63 0.145 1356 0.145 1419 0.986 0.988 100 0.132 2.668-2.851 0.174 80 0.141 1288 0.143 1368 0.982 0.988 100 0.135 2.851-3.078 0.17 71 0.139 1212 0.141 1283 0.981 0.987 100 0.138 3.078-3.369 0.156 60 0.13 1128 0.131 1188 0.985 0.99 100 0.135 3.369-3.763 0.141 56 0.124 1028 0.125 1084 0.992 0.991 100 0.133 3.763-4.338 0.119 51 0.111 925 0.111 976 0.991 0.993 100 0.129 4.338-5.296 0.111 39 0.1 793 0.101 832 0.994 0.995 100 0.12 5.296-7.417 0.185 27 0.139 653 0.141 680 0.984 0.99 100 0.162 7.417-37.904 0.185 17 0.159 407 0.16 424 0.972 0.978 100 0.185