構造決定の手法: 分子置換 / 解像度: 2.022→40.998 Å / Cor.coef. Fo:Fc: 0.92 / Cor.coef. Fo:Fc free: 0.881 / SU B: 18.993 / SU ML: 0.231 / 交差検証法: THROUGHOUT / ESU R: 0.26 / ESU R Free: 0.221 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.307
831
4.984 %
Rwork
0.264
15841
-
all
0.266
-
-
obs
-
16672
93.616 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 37.001 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.427 Å2
-0.213 Å2
-0 Å2
2-
-
-0.427 Å2
0 Å2
3-
-
-
1.385 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.022→40.998 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1747
0
78
25
1850
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.011
0.012
1870
X-RAY DIFFRACTION
r_bond_other_d
0.005
0.016
1663
X-RAY DIFFRACTION
r_angle_refined_deg
1.696
1.841
2555
X-RAY DIFFRACTION
r_angle_other_deg
1.22
1.795
3798
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.833
5
247
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
3.586
5
4
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.165
10
225
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
13.412
10
61
X-RAY DIFFRACTION
r_chiral_restr
0.073
0.2
289
X-RAY DIFFRACTION
r_chiral_restr_other
1.37
0.2
30
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
2188
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
394
X-RAY DIFFRACTION
r_nbd_refined
0.201
0.2
351
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.203
0.2
1621
X-RAY DIFFRACTION
r_nbtor_refined
0.181
0.2
953
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.086
0.2
919
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.163
0.2
57
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.211
0.2
7
X-RAY DIFFRACTION
r_nbd_other
0.216
0.2
30
X-RAY DIFFRACTION
r_mcbond_it
2.446
2.803
1000
X-RAY DIFFRACTION
r_mcbond_other
2.445
2.803
1000
X-RAY DIFFRACTION
r_mcangle_it
3.717
5.03
1243
X-RAY DIFFRACTION
r_mcangle_other
3.716
5.029
1244
X-RAY DIFFRACTION
r_scbond_it
2.097
2.769
870
X-RAY DIFFRACTION
r_scbond_other
2.096
2.769
871
X-RAY DIFFRACTION
r_scangle_it
3.118
5.088
1312
X-RAY DIFFRACTION
r_scangle_other
3.117
5.086
1313
X-RAY DIFFRACTION
r_lrange_it
5.083
25.853
2000
X-RAY DIFFRACTION
r_lrange_other
5.082
25.851
1999
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.101
0.05
3257
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.10085
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.10085
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20