構造決定の手法: 分子置換 / 解像度: 2.5→42.43 Å / Cor.coef. Fo:Fc: 0.915 / Cor.coef. Fo:Fc free: 0.87 / SU B: 37.968 / SU ML: 0.362 / 交差検証法: THROUGHOUT / ESU R: 0.604 / ESU R Free: 0.34 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.3042
478
4.742 %
Rwork
0.2562
9603
-
all
0.258
-
-
obs
-
10081
99.753 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 45.416 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.631 Å2
-0.816 Å2
-0 Å2
2-
-
-1.631 Å2
0 Å2
3-
-
-
5.293 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.5→42.43 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1773
0
78
9
1860
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.012
1895
X-RAY DIFFRACTION
r_bond_other_d
0.006
0.016
1713
X-RAY DIFFRACTION
r_angle_refined_deg
1.673
1.848
2583
X-RAY DIFFRACTION
r_angle_other_deg
1.385
1.803
3929
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.637
5
254
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
5.508
5
2
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.641
10
241
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
13.902
10
53
X-RAY DIFFRACTION
r_chiral_restr
0.072
0.2
294
X-RAY DIFFRACTION
r_chiral_restr_other
1.54
0.2
32
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.02
2178
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
376
X-RAY DIFFRACTION
r_nbd_refined
0.21
0.2
349
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.203
0.2
1641
X-RAY DIFFRACTION
r_nbtor_refined
0.181
0.2
950
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.09
0.2
994
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.151
0.2
53
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.081
0.2
5
X-RAY DIFFRACTION
r_nbd_other
0.14
0.2
22
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.044
0.2
1
X-RAY DIFFRACTION
r_mcbond_it
2.031
2.864
1028
X-RAY DIFFRACTION
r_mcbond_other
2.031
2.864
1028
X-RAY DIFFRACTION
r_mcangle_it
3.339
5.139
1278
X-RAY DIFFRACTION
r_mcangle_other
3.337
5.14
1279
X-RAY DIFFRACTION
r_scbond_it
1.926
2.909
867
X-RAY DIFFRACTION
r_scbond_other
1.925
2.91
868
X-RAY DIFFRACTION
r_scangle_it
3.195
5.326
1305
X-RAY DIFFRACTION
r_scangle_other
3.194
5.327
1306
X-RAY DIFFRACTION
r_lrange_it
5.133
26.637
1997
X-RAY DIFFRACTION
r_lrange_other
5.132
26.644
1998
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.098
0.05
3343
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.09801
0.05009
1
2
A
X-RAY DIFFRACTION
Localncs
0.09801
0.05009
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20