構造決定の手法: 分子置換 / 解像度: 1.8→42.381 Å / Cor.coef. Fo:Fc: 0.951 / Cor.coef. Fo:Fc free: 0.929 / SU B: 6.414 / SU ML: 0.102 / 交差検証法: THROUGHOUT / ESU R: 0.141 / ESU R Free: 0.135 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2573
1314
5.034 %
Rwork
0.2197
24790
-
all
0.221
-
-
obs
-
26104
99.977 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 36.181 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.469 Å2
-0.234 Å2
0 Å2
2-
-
-0.469 Å2
-0 Å2
3-
-
-
1.52 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.8→42.381 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1848
0
74
119
2041
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.01
0.012
1968
X-RAY DIFFRACTION
r_bond_other_d
0.005
0.016
1816
X-RAY DIFFRACTION
r_angle_refined_deg
1.796
1.854
2674
X-RAY DIFFRACTION
r_angle_other_deg
1.148
1.801
4180
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.453
5
254
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
4.137
5
4
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.616
10
282
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
14.641
10
64
X-RAY DIFFRACTION
r_chiral_restr
0.084
0.2
298
X-RAY DIFFRACTION
r_chiral_restr_other
1.48
0.2
26
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.02
2250
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
398
X-RAY DIFFRACTION
r_nbd_refined
0.211
0.2
333
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.195
0.2
1654
X-RAY DIFFRACTION
r_nbtor_refined
0.177
0.2
988
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.082
0.2
994
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.142
0.2
93
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.444
0.2
7
X-RAY DIFFRACTION
r_nbd_other
0.153
0.2
35
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.187
0.2
11
X-RAY DIFFRACTION
r_mcbond_it
2.324
2.426
1028
X-RAY DIFFRACTION
r_mcbond_other
2.324
2.426
1028
X-RAY DIFFRACTION
r_mcangle_it
3.32
4.353
1278
X-RAY DIFFRACTION
r_mcangle_other
3.319
4.353
1279
X-RAY DIFFRACTION
r_scbond_it
2.412
2.499
940
X-RAY DIFFRACTION
r_scbond_other
2.411
2.499
941
X-RAY DIFFRACTION
r_scangle_it
3.503
4.536
1396
X-RAY DIFFRACTION
r_scangle_other
3.502
4.535
1397
X-RAY DIFFRACTION
r_lrange_it
6.008
23.759
2133
X-RAY DIFFRACTION
r_lrange_other
5.988
23.438
2113
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.096
0.05
3554
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.09613
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.09613
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20