構造決定の手法: 分子置換 / 解像度: 2.3→41.858 Å / Cor.coef. Fo:Fc: 0.945 / Cor.coef. Fo:Fc free: 0.94 / SU B: 28.821 / SU ML: 0.297 / 交差検証法: THROUGHOUT / ESU R: 0.397 / ESU R Free: 0.251 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2595
610
5.14 %
Rwork
0.2328
11258
-
all
0.234
-
-
obs
-
11868
99.739 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 54.53 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-2.582 Å2
-1.291 Å2
-0 Å2
2-
-
-2.582 Å2
0 Å2
3-
-
-
8.377 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.3→41.858 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1818
0
74
20
1912
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.01
0.012
1937
X-RAY DIFFRACTION
r_bond_other_d
0.003
0.016
1806
X-RAY DIFFRACTION
r_angle_refined_deg
1.902
1.864
2623
X-RAY DIFFRACTION
r_angle_other_deg
0.772
1.81
4166
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.647
5
246
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
6.82
5
4
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.475
10
288
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
13.002
10
66
X-RAY DIFFRACTION
r_chiral_restr
0.085
0.2
288
X-RAY DIFFRACTION
r_chiral_restr_other
0.875
0.2
28
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
2191
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
389
X-RAY DIFFRACTION
r_nbd_refined
0.204
0.2
328
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.198
0.2
1707
X-RAY DIFFRACTION
r_nbtor_refined
0.181
0.2
953
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.084
0.2
1005
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.147
0.2
44
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.173
0.2
10
X-RAY DIFFRACTION
r_nbd_other
0.147
0.2
63
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.15
0.2
2
X-RAY DIFFRACTION
r_mcbond_it
3.539
3.764
996
X-RAY DIFFRACTION
r_mcbond_other
3.539
3.764
996
X-RAY DIFFRACTION
r_mcangle_it
5.464
6.755
1238
X-RAY DIFFRACTION
r_mcangle_other
5.462
6.754
1239
X-RAY DIFFRACTION
r_scbond_it
3.045
3.755
941
X-RAY DIFFRACTION
r_scbond_other
3.044
3.755
942
X-RAY DIFFRACTION
r_scangle_it
4.805
6.853
1385
X-RAY DIFFRACTION
r_scangle_other
4.803
6.852
1386
X-RAY DIFFRACTION
r_lrange_it
7.194
33.914
2034
X-RAY DIFFRACTION
r_lrange_other
7.192
33.91
2035
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.112
0.05
3244
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.11175
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.11175
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20