構造決定の手法: 分子置換 / 解像度: 1.5→60.965 Å / Cor.coef. Fo:Fc: 0.971 / Cor.coef. Fo:Fc free: 0.964 / WRfactor Rfree: 0.191 / WRfactor Rwork: 0.167 / SU B: 1.305 / SU ML: 0.048 / Average fsc free: 0.9728 / Average fsc work: 0.9794 / 交差検証法: THROUGHOUT / ESU R: 0.065 / ESU R Free: 0.066 詳細: Hydrogens have been used if present in the input file
Rfactor
反射数
%反射
Rfree
0.189
8633
5.041 %
Rwork
0.1657
162639
-
all
0.167
-
-
obs
-
171272
98.733 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 20.922 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.197 Å2
0 Å2
-0.376 Å2
2-
-
1.682 Å2
0 Å2
3-
-
-
-0.933 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.5→60.965 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
7306
0
147
883
8336
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.012
7845
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.016
7309
X-RAY DIFFRACTION
r_angle_refined_deg
1.8
1.83
10647
X-RAY DIFFRACTION
r_angle_other_deg
0.624
1.776
16884
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.762
5
938
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
5.853
5
35
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.091
10
1401
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
14.906
10
392
X-RAY DIFFRACTION
r_chiral_restr
0.098
0.2
1155
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.02
9089
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
1863
X-RAY DIFFRACTION
r_nbd_refined
0.223
0.2
1247
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.176
0.2
6163
X-RAY DIFFRACTION
r_nbtor_refined
0.181
0.2
3688
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.077
0.2
3806
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.135
0.2
524
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.175
0.2
16
X-RAY DIFFRACTION
r_nbd_other
0.146
0.2
41
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.168
0.2
27
X-RAY DIFFRACTION
r_mcbond_it
1.844
1.805
3643
X-RAY DIFFRACTION
r_mcbond_other
1.842
1.804
3643
X-RAY DIFFRACTION
r_mcangle_it
2.665
3.25
4580
X-RAY DIFFRACTION
r_mcangle_other
2.665
3.25
4581
X-RAY DIFFRACTION
r_scbond_it
3.103
2.129
4202
X-RAY DIFFRACTION
r_scbond_other
3.102
2.129
4203
X-RAY DIFFRACTION
r_scangle_it
4.697
3.764
6055
X-RAY DIFFRACTION
r_scangle_other
4.696
3.764
6056
X-RAY DIFFRACTION
r_lrange_it
5.881
21.582
8730
X-RAY DIFFRACTION
r_lrange_other
5.806
20.492
8554
X-RAY DIFFRACTION
r_ncsr_local_group_1
0.091
0.05
14726
Refine LS restraints NCS
Ens-ID
Dom-ID
Auth asym-ID
Refine-ID
タイプ
Rms dev position (Å)
Weight position
1
1
A
X-RAY DIFFRACTION
Localncs
0.09139
0.05008
1
2
A
X-RAY DIFFRACTION
Localncs
0.09139
0.05008
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20