構造決定の手法: 分子置換 / 解像度: 1.914→94.5 Å / Cor.coef. Fo:Fc: 0.93 / Cor.coef. Fo:Fc free: 0.914 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.373 / SU Rfree Blow DPI: 0.238 詳細: HYDROGENS WERE FULLY REFINED WITH ZERO OCCUPANCY AT ELECTRON-CLOUD POSITION.
Rfactor
反射数
%反射
Selection details
Rfree
0.262
1523
5.03 %
RANDOM
Rwork
0.23
-
-
-
obs
0.2316
30288
62.1 %
-
原子変位パラメータ
Biso mean: 49.37 Å2
Baniso -1
Baniso -2
Baniso -3
1-
3.8002 Å2
0 Å2
3.8614 Å2
2-
-
0.5779 Å2
0 Å2
3-
-
-
-4.3781 Å2
Refine analyze
Luzzati coordinate error obs: 0.32 Å
精密化ステップ
サイクル: LAST / 解像度: 1.914→94.5 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4630
0
142
251
5023
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.009
9599
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
0.85
17441
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
2863
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
X-RAY DIFFRACTION
t_gen_planes
1532
HARMONIC
5
X-RAY DIFFRACTION
t_it
4876
HARMONIC
10
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
2.62
X-RAY DIFFRACTION
t_other_torsion
14.73
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
606
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
8692
SEMIHARMONIC
4
LS精密化 シェル
解像度: 1.914→2.04 Å
Rfactor
反射数
%反射
Rfree
0.2359
-
4.95 %
Rwork
0.2974
576
-
obs
-
-
7.35 %
精密化 TLS
手法: refined / Origin x: -23.8686 Å / Origin y: -19.5241 Å / Origin z: -21.0705 Å