構造決定の手法: 分子置換 / 解像度: 1.33→37.091 Å / Cor.coef. Fo:Fc: 0.972 / Cor.coef. Fo:Fc free: 0.965 / SU B: 3.213 / SU ML: 0.056 / 交差検証法: THROUGHOUT / ESU R: 0.058 / ESU R Free: 0.056 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2007
1523
5.105 %
Rwork
0.1654
28311
-
all
0.167
-
-
obs
-
29834
99.586 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 18.489 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.464 Å2
-0 Å2
-0 Å2
2-
-
-2.141 Å2
0 Å2
3-
-
-
2.605 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.33→37.091 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
950
0
54
151
1155
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.012
1059
X-RAY DIFFRACTION
r_bond_other_d
0.005
0.017
982
X-RAY DIFFRACTION
r_angle_refined_deg
1.916
1.716
1437
X-RAY DIFFRACTION
r_angle_other_deg
1.232
1.665
2271
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
8.202
5
133
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
3.953
5
3
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.31
10
155
X-RAY DIFFRACTION
r_dihedral_angle_6_deg
17.454
10
38
X-RAY DIFFRACTION
r_chiral_restr
0.092
0.2
153
X-RAY DIFFRACTION
r_chiral_restr_other
1.358
0.2
17
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.02
1211
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
219
X-RAY DIFFRACTION
r_nbd_refined
0.19
0.2
181
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.183
0.2
935
X-RAY DIFFRACTION
r_nbtor_refined
0.18
0.2
525
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.083
0.2
523
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.135
0.2
97
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.479
0.2
5
X-RAY DIFFRACTION
r_nbd_other
0.25
0.2
44
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.194
0.2
15
X-RAY DIFFRACTION
r_mcbond_it
1.809
2.005
529
X-RAY DIFFRACTION
r_mcbond_other
1.81
2.006
528
X-RAY DIFFRACTION
r_mcangle_it
2.499
3.616
663
X-RAY DIFFRACTION
r_mcangle_other
2.497
3.614
664
X-RAY DIFFRACTION
r_scbond_it
1.777
2.133
530
X-RAY DIFFRACTION
r_scbond_other
1.775
2.135
531
X-RAY DIFFRACTION
r_scangle_it
2.375
3.832
774
X-RAY DIFFRACTION
r_scangle_other
2.373
3.833
775
X-RAY DIFFRACTION
r_lrange_it
4.203
24.032
1215
X-RAY DIFFRACTION
r_lrange_other
3.595
22.011
1168
X-RAY DIFFRACTION
r_rigid_bond_restr
4.994
3
2041
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20